Kienzle, O., Ernst, F., Rühle, M., Schmidt, O., & Eberl, K.(1999).Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening.Applied Physics Letters,74, 269–271.
Baither, D., Ernst, F., Wagner, T., Rühle, M., Bartsch, M., & Messerschmidt, U.(1999).Micromechanisms of Fracture in NiAl, Studied by in situ HVEM.Intermetallics,9, 479–489.
Han, W., Redlich, P., Ernst, F., & Rühle, M.(1999).Synthesizing Boron Nitride Nanotubes Filled with SiC Nanowires by Using Carbon Nanotubes as Templates.Applied Physics Letters,75, 1875–1877.
Schweinfest, R., Ernst, F., Wagner, T., & Rühle, M.(1999).High-Precision Assessment of Interface Lattice Offset by Quantitative HRTEM.Journal of Microscopy,194, 142–151.
French, R. H., Reynolds, G. H., Francis Carcia, P. H., Torardi, C. H., Hughes, G. H., & Jones, D. H.(1998).{TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography.SPIE,3546
French, R. H., Müllejans, H. H., & Jones, D. H.(1998).Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging.Acta Materialia,46(7),2271-2287.
Kienzle, O., Exner, M., & Ernst, F.(1998).Atomistic Structure of =3, (111) Grain Boundaries in Strontium Titanate.Physica Status Solidi (a),166, 57–71.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).Influence of Pre-Grown Carbon on the Formation of Germanium Dots.Thin Solid Films,321, 70–75.
Kienzle, O., Ernst, F., & Mobus, G.(1998).Reliability of Atom Column Positions in a Ternary System Determined by Quantitative High-Resolution Transmission Electron Microscopy.Journal of Microscopy,190, 144–158.
Schmidt, C., Finnis, M., Ernst, F., & Vitek, V.(1998).Theoretical and Experimental Investigations of Structures and Energies of 3, [112] Tilt Grain Boundaries in Copper.Philosophical Magazine A,77, 1161–1184.
Wöhl, G., Schöllhorn, C., Schmidt, O., Brunner, K., Eberl, K., Kienzle, O., & Ernst, F.(1998).Characterization of Self-Assembled Ge Islands on Si (100) by Atomic Force Microscopy and Transmission Electron Microscopy.Thin Solid Films,321, 86–91.
Haalboom, T., Gödecke, T., Ernst, F., Rühle, M., Herberholz, R., Schock, H., Beilharz, C., & Benz, K.(1998).Phase Relations and Microstructure of Bulk Material and Thin Films of the Ternary System Cu–In–Se.IOP Publishing,152 B, 249–252.
