Han, W., Redlich, P., Ernst, F., & Rühle, M.(1999).Formation of (BN)xCy and BN Nanotubes Filled with Boron Carbide Nanowires.Chemistry of Materials,11, 3620–3623.
Lyutovich, K., Ernst, F., Kasper, E., Bauer, M., & Oehme, M.(1999).Interaction Between Point Defects and Dislocations in SiGe.Solid State Phenomena,69–79, 179–184.
Ernst, F., Kienzle, O., & Rühle, M.(1999).Structure and Composition of Grain Boundaries in Ceramics.Journal of the European Ceramic Society,19, 665–673.
Kienzle, O., Ernst, F., Rühle, M., Schmidt, O., & Eberl, K.(1999).Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening.Applied Physics Letters,74, 269–271.
Baither, D., Ernst, F., Wagner, T., Rühle, M., Bartsch, M., & Messerschmidt, U.(1999).Micromechanisms of Fracture in NiAl, Studied by in situ HVEM.Intermetallics,9, 479–489.
French, R. H., Reynolds, G. H., Francis Carcia, P. H., Torardi, C. H., Hughes, G. H., & Jones, D. H.(1998).{TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography.SPIE,3546
French, R. H., Müllejans, H. H., & Jones, D. H.(1998).Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging.Acta Materialia,46(7),2271-2287.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures.Thin Solid Films,336, 248–251.
Mader, W., & Ernst, F.(1998).Papers Dedicated To Professor Dr. Manfred Rühle on the Occasion of His 60th Birthday– Preface.Physica Status Solidi A,166(1),5-6.
Schweinfest, R., Ernst, F., Wagner, T., & Rühle, M.(1998).Quantitative HRTEM at the Al/MgAl2O4 Interface: Translation State and Its Reliability.,1, 635-636.
Kienzle, O., Exner, M., & Ernst, F.(1998).Atomistic Structure of =3, (111) Grain Boundaries in Strontium Titanate.Physica Status Solidi (a),166, 57–71.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).Influence of Pre-Grown Carbon on the Formation of Germanium Dots.Thin Solid Films,321, 70–75.
Kienzle, O., Ernst, F., & Mobus, G.(1998).Reliability of Atom Column Positions in a Ternary System Determined by Quantitative High-Resolution Transmission Electron Microscopy.Journal of Microscopy,190, 144–158.
Schmidt, C., Finnis, M., Ernst, F., & Vitek, V.(1998).Theoretical and Experimental Investigations of Structures and Energies of 3, [112] Tilt Grain Boundaries in Copper.Philosophical Magazine A,77, 1161–1184.
Wöhl, G., Schöllhorn, C., Schmidt, O., Brunner, K., Eberl, K., Kienzle, O., & Ernst, F.(1998).Characterization of Self-Assembled Ge Islands on Si (100) by Atomic Force Microscopy and Transmission Electron Microscopy.Thin Solid Films,321, 86–91.
