Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures.Thin Solid Films,336, 248–251.
Mader, W., & Ernst, F.(1998).Papers Dedicated To Professor Dr. Manfred Rühle on the Occasion of His 60th Birthday– Preface.Physica Status Solidi A,166(1),5-6.
Schweinfest, R., Ernst, F., Wagner, T., & Rühle, M.(1998).Quantitative HRTEM at the Al/MgAl2O4 Interface: Translation State and Its Reliability.,1, 635-636.
French, R. H., Johnson, R. H., & Thiele, E. H.(1997).Light-scattering efficiency of white pigments: an analysis of model core - shell pigments vs. optimized rutile {TiO2}.{TAPPI} Journal,80, 233-239.
French, R. H., & Thiele, E. H.(1997).Computational Modeling of {TiO2} Particle Optics Using a Finite Element Method.Proceedings of the Paint Research Association.
French, R. H., & Müllejans, H. H.(1997).Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure.Proceedings of the Microscopy Society of America.
Baither, D., Messerschmidt, U., Baufeld, B., Bartsch, M., & Ernst, F.(1997).In-situ Straining Experiments in HVEM to Study Deformation of Zirconia and NiAl..
French, R. H., Francis Carcia, P. H., & Jones, D. H.(1997).Optical superlattices—a strategy for designing phase-shift masks for photolithography at 248 and 193 nm: Application to {AlN/CrN}.Applied Physics Letters,70(18),2371-2373.
Recnik, A., Langjahr, P., & Ernst, F.(1997).Structural Characterization of SrZrO3/SrTiO3 Epitaxial Layers by HRTEM.Journal of Computer-Assisted Microscopy,9, 35–36.
Kienzle, O., Exner, M., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy.,466, 95-106.
Ernst, F.(1997).Interface Dislocations Forming in GeSi Layers During Epitaxy on {111} Si Substrates at High Temperatures.Materials Science and Engineering A,233, 126–138.
Klement, U., Horst, D., & Ernst, F.(1997).Microstructure of Thin Film Photoconductors and its Correlation with Optical and Electronic Properties.,452, 925–930.
