![Engineer Using PHI TRIFT V nanoTOF Time-of-Flight Secondary Ion Mass Spectrometer](https://engineering.case.edu/sites/default/files/styles/page_image/public/210427_CWRU_%20Engineering_Lab_48_HIGHRES.jpg?itok=_iQoe2xO)
The properties of materials are determined by their structure and microstructure, and though the image analysis and surface analysis techniques can provide some information it is often necessary or cost-effective to try alternative methods of measuring atomic crystal structure or localized material properties.