X-ray fluorescence spectroscopy is a nondestructive method to quickly and accurately measure the composition of materials with minimal sample preparation. Samples do not have to be subjected to vacuum for identification of chemical composition, impurities, and additives. A handheld system has applications in metallurgy, geology, art conservation, archeology, soil analysis, concrete analysis, and food safety analysis.
The Bruker Tracer 5g portable X-ray fluorescence (XRF) elemental analyzer incorporates a Silicon Drift Detector (SDD) with a graphene entrance window. The graphene window has high transmission of X-rays throughout the energy spectrum which dramatically improves sensitivity for light elements such as Na, Mg, Si and Al. Elements from sodium to uranium can be detected at <100 ppm levels for most elements. Matrix-matched calibrations for alloys and geological materials allow quantification of 48 elements.
- 50kV-4W Rh target X-ray source
- Graphene window, 20 mm2 silicon drift detector (SDD) with typical resolution <140 eV at 450,000 cps
- User controlled current and voltage
- Selectable measurement spot size 3 mm or 8 mm
- 5 position automatic filter wheel
- Integrated processor and data storage
- Interactive touch screen display
- Internal sample camera
- Wi-Fi and USB connectivity
- Live spectra directly on the TRACER 5 and on PC
- PC Connectivity: Wi-Fi or wired USB
- ARTAX PC software for comprehensive analysis