Nikam, V., Reddy, R., Collins, S., Williams, P., Schiroky, G., & Henrich, G.(2008).Corrosion resistant low temperature carburized SS 316 as bipolar plate material for PEMFC application.ELECTROCHIMICA ACTA,53(6),2743-2750.
Du, K., Ernst, F., Garrels, M., & Payer, J.(2008).Formation of Nickel Nanoparticles in Nickel–Ceramic Anodes of Solid-Oxide Fuel Cells.International Journal of Materials Research,99, 548-552.
French, R. H., Liberman, V. H., Tran, H. H., Feldman, J. H., Adelman, D. H., Wheland, R. H., Qiu, W. H., McLain, S. H., Kaku, M. H., Mocella, M. H., Nagao, K. H., & Person, N. H.(2007).High-index immersion lithography with second-generation immersion fluids to enable numerical aperatures of 1.55 for cost effective 32-nm half pitches..
French, R. H., Winey, K. H., Yang, S. H., & Qiu, W. H.(2007 ).Optical Properties and van der Waals–London Dispersion Interactions of Polystyrene Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry.Australian Journal of Chemistry,60(251).
Heuer, A. H., Ernst, F. H., Kahn, H. H., Avishai, A. H., Michal, G. H., Pitchure, D. H., & Ricker, R. H.(2007).Interstitial Defects in an Austenitic Stainless Steel Containing “Colossal” Carbon Concentrations: An Internal Friction Study.Scripta Materialia,56, 1067-1070.
Avishai, A., Isheim, D., Seidman, D., Ernst, F., Michal, G., & Heuer, A. H.(2007).Local-Electrode Atom Probe (LEAP™) Tomographic Microanalysis of Low-Temperature Gas-Carburized Austenitic Stainless Steel.Microscopy&Microanalysis,13 Suppl. 2, 1094-1095.
Singh, G., Yu, Y., Ernst, F., & Nataraj, R.(2007).Shear Strength and Sliding at a Metal–Ceramic (Aluminum-Spinel) Interface at Ambient and Elevated Temperature.Acta Materialia,55, 3049-57.
Benthem, K., Tan, G., French, R. H., Denoyer, L. H., Podgornik, R. H., & Parsegian, V. H.(2006).Graded interface models for more accurate determination of van der {Waals–London} dispersion interactions across grain boundaries.Physical Review B,74
French, R. H.(2006).Origins and Applications of London Dispersion Interactions in Polymers and Other Materials: Electronic Structure, Optical Properties and Chemistry.Polymer Division, Royal Australian Chemical Institute.
French, R. H., Thorne, J. H., Hochstrasser, R. H., Ziegler, J. H., Tilgner, A. H., Fagan, P. H., & Miller, R. H.(2006).Electronic and Vibrational Excitations in Polysilanes and Oligomers.Molecular Crystals and Liquid Crystals,216(1),13-19.
Paumier, F., Fouquet, V., Guittet, M., Gautier-Soyer, M., French, R. H., Tan, G. H., Chiang, Y. H., Tang, L. H., Ramos, A. H., & Chung, S. H.(2006).Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate.Materials Science and Engineering: A,422, 29-40.
Tan, G., & French, R. H.(2006).Optical properties, electronic structure and London dispersion interactions for nanostructured interfacial and surficial films.Materials Science and Engineering: A,422, 136–146.
French, R. H.(2006).Simulated measurement of small metal clusters by frequency-modulation non-contact atomic force microscopy.Nanotechnology,17, S121–S127.
Feiring, A., Crawford, M., Farnham, W., Feldman, J., French, R. H., Junk, C. H., Leffew, K. H., Petrov, V. H., Qiu, W. H., Schadt, F. H., Tran, H. H., & Zumsteg, F. H.(2006).New Amorphous Fluoropolymers of Tetrafluoroethylene with Fluorinated and {Non-Fluorinated} Tricyclononenes. Semiconductor Photoresists for Imaging at 157 and 193 nm.Macromolecules,39, 3252–3261.
French, R. H., Qiu, W. H., Yang, S. H., Wheland, R. H., Lemon, M. H., Shoe, A. H., Adelman, D. H., Crawford, M. H., Tran, H. H., Feldman, J. H., McLain, S. H., & Peng, S. H.(2006).Second generation fluids for 193nm immersion lithography..
Feiring, A., Crawford, M., Farnham, W., French, R. H., Leffew, K. H., Petrov, V. H., Schadt, F. H., Tran, H. H., & Zumsteg, F. H.(2006).Bis(fluoroalcohol) Monomers and Polymers: Improved Transparency Fluoropolymer Photoresists for Semiconductor Photolithography at 157 nm.Macromolecules,39, 1443–1448.
Du, K., & Ernst, F.(2006).Quantitative Assessment of Nanoparticle Size Distributions from HRTEM Images.International Journal of Materials Research,97, 928-933.
