Predictive Models of Poly(ethylene-terephthalate) Film Degradation Under Multi-Factor Accelerated Weathering Exposures Read more about Predictive Models of Poly(ethylene-terephthalate) Film Degradation Under Multi-Factor Accelerated Weathering Exposures
Characterizing the weathering induced haze formation and gloss loss of poly(ethylene-terephthalate) via MaPd:RTS spectroscopy Read more about Characterizing the weathering induced haze formation and gloss loss of poly(ethylene-terephthalate) via MaPd:RTS spectroscopy
Degradation in PV Encapsulant Strength of Attachment: An Interlaboratory Study Towards a Climate-Specific Test: Preprint Read more about Degradation in PV Encapsulant Strength of Attachment: An Interlaboratory Study Towards a Climate-Specific Test: Preprint
A Nonrelational Data Warehouse for the Analysis of Field and Laboratory Data From Multiple Heterogeneous Photovoltaic Test Sites Read more about A Nonrelational Data Warehouse for the Analysis of Field and Laboratory Data From Multiple Heterogeneous Photovoltaic Test Sites
Toward Ultralow-Power Computing at Exteme with Silicon Carbide (SiC) Nanoelectromechanical Logic Read more about Toward Ultralow-Power Computing at Exteme with Silicon Carbide (SiC) Nanoelectromechanical Logic
Silicon Carbide (SiC) Nanoelectromechanical Antifuse for Ultralow-Power One-Time-Programmable (OTP) FPGA Interconnects Read more about Silicon Carbide (SiC) Nanoelectromechanical Antifuse for Ultralow-Power One-Time-Programmable (OTP) FPGA Interconnects
Authentication of Medicines using Nuclear Quadrupole Resonance Spectroscopy Read more about Authentication of Medicines using Nuclear Quadrupole Resonance Spectroscopy
Tunable and Lightweight On-Chip Event Detection for Implantable Bladder Pressure Monitoring Devices Read more about Tunable and Lightweight On-Chip Event Detection for Implantable Bladder Pressure Monitoring Devices
Security vulnerability analysis of design-for-test exploits for asset protection in SoCs Read more about Security vulnerability analysis of design-for-test exploits for asset protection in SoCs
