Ernst, F., Kienzle, O., & Rühle, M.(1999).Structure and Composition of Grain Boundaries in Ceramics.Journal of the European Ceramic Society,19, 665–673.
Kienzle, O., Ernst, F., Rühle, M., Schmidt, O., & Eberl, K.(1999).Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening.Applied Physics Letters,74, 269–271.
Baither, D., Ernst, F., Wagner, T., Rühle, M., Bartsch, M., & Messerschmidt, U.(1999).Micromechanisms of Fracture in NiAl, Studied by in situ HVEM.Intermetallics,9, 479–489.
French, R. H., Reynolds, G. H., Francis Carcia, P. H., Torardi, C. H., Hughes, G. H., & Jones, D. H.(1998).{TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography.SPIE,3546
French, R. H., Müllejans, H. H., & Jones, D. H.(1998).Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging.Acta Materialia,46(7),2271-2287.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures.Thin Solid Films,336, 248–251.
Haalboom, T., Gödecke, T., Ernst, F., Rühle, M., Herberholz, R., Schock, H., Beilharz, C., & Benz, K.(1998).Phase Relations and Microstructure of Bulk Material and Thin Films of the Ternary System Cu–In–Se.IOP Publishing,152 B, 249–252.
Kienzle, O., Exner, M., & Ernst, F.(1998).Atomistic Structure of =3, (111) Grain Boundaries in Strontium Titanate.Physica Status Solidi (a),166, 57–71.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).Influence of Pre-Grown Carbon on the Formation of Germanium Dots.Thin Solid Films,321, 70–75.
Mader, W., & Ernst, F.(1998).Papers Dedicated To Professor Dr. Manfred Rühle on the Occasion of His 60th Birthday– Preface.Physica Status Solidi A,166(1),5-6.
Schweinfest, R., Ernst, F., Wagner, T., & Rühle, M.(1998).Quantitative HRTEM at the Al/MgAl2O4 Interface: Translation State and Its Reliability.,1, 635-636.
Wöhl, G., Schöllhorn, C., Schmidt, O., Brunner, K., Eberl, K., Kienzle, O., & Ernst, F.(1998).Characterization of Self-Assembled Ge Islands on Si (100) by Atomic Force Microscopy and Transmission Electron Microscopy.Thin Solid Films,321, 86–91.
