Haalboom, T., Gödecke, T., Ernst, F., Rühle, M., Herberholz, R., Schock, H., Beilharz, C., & Benz, K.(1998).Phase Relations and Microstructure of Bulk Material and Thin Films of the Ternary System Cu–In–Se.IOP Publishing,152 B, 249–252.
French, R. H., Johnson, R. H., & Thiele, E. H.(1997).Light-scattering efficiency of white pigments: an analysis of model core - shell pigments vs. optimized rutile {TiO2}.{TAPPI} Journal,80, 233-239.
French, R. H., & Thiele, E. H.(1997).Computational Modeling of {TiO2} Particle Optics Using a Finite Element Method.Proceedings of the Paint Research Association.
French, R. H., & Müllejans, H. H.(1997).Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure.Proceedings of the Microscopy Society of America.
Baither, D., Messerschmidt, U., Baufeld, B., Bartsch, M., & Ernst, F.(1997).In-situ Straining Experiments in HVEM to Study Deformation of Zirconia and NiAl..
French, R. H., Francis Carcia, P. H., & Jones, D. H.(1997).Optical superlattices—a strategy for designing phase-shift masks for photolithography at 248 and 193 nm: Application to {AlN/CrN}.Applied Physics Letters,70(18),2371-2373.
Schweinfest, R., Gemming, T., Kopold, P., Ernst, F., & Rühle, M.(1997).Measurement of Tridentate Astigmatism of a Conventional HRTEM and a high-vacuum HRTEM.European Journal of Cell Biology,74, 78-78.
Ernst, F., & Rühle, M.(1997).Present Developments in High-Resolution Transmission Electron Microscopy.Current Opinion in Solid State & Material Science,2, 469-476.
Nadarzinski, K., Kienzle, O., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy.San Francisco Press Inc..
Lyutovich, K., Ernst, F., Banhart, F., Silier, I., Gutjahr, A., & Konuma, M.(1997).Defect Distribution in Compositionally-Graded EpitaxialSiGeLayers on Si Substrates.Inst. Phys. Conf. Ser.,157, 131–134.
Recnik, A., Langjahr, P., & Ernst, F.(1997).Structural Characterization of SrZrO3/SrTiO3 Epitaxial Layers by HRTEM.Journal of Computer-Assisted Microscopy,9, 35–36.
Kienzle, O., Exner, M., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy.,466, 95-106.
Ernst, F.(1997).Interface Dislocations Forming in GeSi Layers During Epitaxy on {111} Si Substrates at High Temperatures.Materials Science and Engineering A,233, 126–138.
Klement, U., Horst, D., & Ernst, F.(1997).Microstructure of Thin Film Photoconductors and its Correlation with Optical and Electronic Properties.,452, 925–930.
