Welcome-Overview of Services

SCSAM continues to serve our customers while taking the utmost precautions to ensure the health and safety of everyone. As we monitor the local, regional and national directives, we continue to adjust and adapt our business operations accordingly and will communicate any changes.

As of April 2021, the SCSAM engineers have been training CWRU users on the Helios, Apreo, TOF-SIMS, XPS, Keyence, and Sputter Coater.

All users (independent of past training) will need to be re-trained by the SCSAM staff. New staff means new training for everyone!

Requests for training and instrumentation services can be communicated via email or by calling 216.368.6012.

Please note that as of October 12, 2020, SCSAM has transitioned to using ILAB to schedule instrumentation requests within the center. Please click the 'Scheduler' tab at the left for more information.

SCSAM (Swagelok Center for Surface Analysis of Materials) is CWRU’s (Case Western Reserve University’s) facility for microcharacterization of materials. SCSAM is a multi-user facility offering a suite of instrumentation for materials characterization and surface and near-surface chemical analysis. SCSAM’s facilities are available to all faculty, research staff, and student users on the CWRU campus and to equivalent academic users throughout Ohio at standard hourly use charges. The equipment described here is maintained by SCSAM’s Faculty Director and 2.25 full-time PhD-level engineers. The staff and service contracts for the instruments are supported by user fees, augmented by income from a dedicated endowment. The following subsections describe SCSAM’s instrumentation:

Scanning Electron Microscopes
- ThermoFisher Apreo 2S (NSF MRI Award: 2018167, Installed March 2021)
Dual-Beam Focused Ion Beam, Scanning Electron Microscopes
- FEI Helios NanoLab 650 Dual-Beam System (Acquired 2010)
Transmission Electron Microscope and Sample Preparation
- Remote Access Console to ThermoFisher TEMs at Ohio State University Center for Electron Microscopy and Surface Analysis (CEMAS) (installed June 2021)
  - Tecnai G2-30
  - Titan 60-300
  - Themis Z S/TEM
- Gatan Ilion Ion Polisher
- Gatan PIPS
Analytical Capabilities
- PHI 680 Scanning Auger Microprobe (Acquired used 2003)
- PHI VersaProbe Scanning XPS Microprobe (Acquired 2007)
- PHI NanoTOF Time-of-Flight Secondary-Ion Mass Spectrometer (Acquired 2009)
X-ray Diffraction
- Bruker D8 X-ray Diffractometer with 1D and 2D Detectors
Surface Analysis

Each year more than 250 individual researchers from the academic, non-profit, and commercial sectors recognize the advantages and benefits SCSAM delivers. From students, startup enterprises, and prominent industrial businesses, SCSAM is mindful of our client's requirements and partners with them to efficiently extract valuable and informative data.

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