Benthem, K., Tan, G., French, R. H., Denoyer, L. H., Podgornik, R. H., & Parsegian, V. H.(2006).Graded interface models for more accurate determination of van der {Waals–London} dispersion interactions across grain boundaries.Physical Review B,74
French, R. H.(2006).Origins and Applications of London Dispersion Interactions in Polymers and Other Materials: Electronic Structure, Optical Properties and Chemistry.Polymer Division, Royal Australian Chemical Institute.
French, R. H., Thorne, J. H., Hochstrasser, R. H., Ziegler, J. H., Tilgner, A. H., Fagan, P. H., & Miller, R. H.(2006).Electronic and Vibrational Excitations in Polysilanes and Oligomers.Molecular Crystals and Liquid Crystals,216(1),13-19.
Paumier, F., Fouquet, V., Guittet, M., Gautier-Soyer, M., French, R. H., Tan, G. H., Chiang, Y. H., Tang, L. H., Ramos, A. H., & Chung, S. H.(2006).Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate.Materials Science and Engineering: A,422, 29-40.
Tan, G., & French, R. H.(2006).Optical properties, electronic structure and London dispersion interactions for nanostructured interfacial and surficial films.Materials Science and Engineering: A,422, 136–146.
French, R. H.(2006).Simulated measurement of small metal clusters by frequency-modulation non-contact atomic force microscopy.Nanotechnology,17, S121–S127.
Feiring, A., Crawford, M., Farnham, W., Feldman, J., French, R. H., Junk, C. H., Leffew, K. H., Petrov, V. H., Qiu, W. H., Schadt, F. H., Tran, H. H., & Zumsteg, F. H.(2006).New Amorphous Fluoropolymers of Tetrafluoroethylene with Fluorinated and {Non-Fluorinated} Tricyclononenes. Semiconductor Photoresists for Imaging at 157 and 193 nm.Macromolecules,39, 3252–3261.
French, R. H., Qiu, W. H., Yang, S. H., Wheland, R. H., Lemon, M. H., Shoe, A. H., Adelman, D. H., Crawford, M. H., Tran, H. H., Feldman, J. H., McLain, S. H., & Peng, S. H.(2006).Second generation fluids for 193nm immersion lithography..
Feiring, A., Crawford, M., Farnham, W., French, R. H., Leffew, K. H., Petrov, V. H., Schadt, F. H., Tran, H. H., & Zumsteg, F. H.(2006).Bis(fluoroalcohol) Monomers and Polymers: Improved Transparency Fluoropolymer Photoresists for Semiconductor Photolithography at 157 nm.Macromolecules,39, 1443–1448.
(2005).Optical properties and London dispersion interaction of amorphous and crystalline {SiO2} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry.Physical Review B,72
French, R. H., Sewell, H. H., Yang, S. H., Peng, S. H., McCafferty, D. H., Qiu, W. H., Wheland, R. H., Lemon, M. H., Markoya, L. H., & Crawford, M. H.(2005).Imaging of 32-nm 1:1 lines and spaces using 193-nm immersion interference lithography with second-generation immersion fluids to achieve a numerical aperture of 1.5 and a k[sub 1] of 0.25.Journal of Microlithography, Microfabrication, and Microsystems,4, 031103.
Peng, S., French, R. H., Qiu, W. H., Wheland, R. H., Yang, S. H., Lemon, M. H., & Crawford, M. H.(2005).Second generation fluids for 193 nm immersion lithography.Proceedings of SPIE.
Mo, S., Ching, W., & French, R. H.(2005).Electronic Structure of a Near Σ11 a-axis Tilt Grain Boundary in {α-A12O3}.Journal of the American Ceramic Society,79, 627–633.
French, R. H.(2005).{Kramers–Kronig} transform for the surface energy loss function.Journal of Electron Spectroscopy and Related Phenomena,142, 97–103.
French, R. H., Müllejans, H. H., & Jones, D. H.(2005).Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron {Energy-Loss} Spectroscopies.Journal of the American Ceramic Society,81, 2549–2557.
Thiele, E., & French, R. H.(2005).{Light-Scattering} Properties of Representative, Morphological Rutile Titania Particles Studied Using a {Finite-Element} Method.Journal of the American Ceramic Society,81, 469–479.
Smith, J., French, R. H., Duscher, G. H., & Bonnell, D. H.(2004).Consequence of {Nanometer-Scale} Property Variations to Macroscopic Properties of {CrOCN} Thin Films.Journal of the American Ceramic Society,84, 2873–2881.
French, R. H.(2004).Origins and Applications of London Dispersion Forces and Hamaker Constants in Ceramics.Journal of the American Ceramic Society,83, 2117–2146.
Tan, G., Lemon, M., & French, R. H.(2004).Optical Properties and London Dispersion Forces of Amorphous Silica Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry.Journal of the American Ceramic Society,86, 1885–1892.