French, R. H.(2001).Valence electron energy loss study of Fe-doped {SrTiO3} and a Σ13 boundary: electronic structure and dispersion forces.Ultramicroscopy,86, 303–318.
French, R. H.(2001).Light scattering from red pigment particles: Multiple scattering in a strongly absorbing system.Journal of Applied Physics,89, 283.
French, R. H., Wheland, R. H., Jones, D. H., Hilfiker, J. H., Synowicki, R. H., Zumsteg, F. H., Feldman, J. H., & Feiring, A. H.(2000).Fluoropolymers for 157-nm lithography: optical properties from {VUV} absorbance and ellipsometry measurements.Proceedings of SPIE Vol. 4000,4000
French, R. H., & Müllejans, H. H.(2000).Insights Into the Electronic Structure of Ceramics Through Quantitative Analysis of Valence Electron Energy-loss Spectroscopy {(VEELS)}.Microscopy and Microanalysis,6, 297-306.
French, R. H., Crawford, M. H., Feiring, A. H., Feldman, J. H., Periyasamy, M. H., Schadt, F. H., Smalley, R. H., Zumsteg, F. H., Kunz, R. H., Rao, V. H., Lao, L. H., & Holl, S. H.(2000).New materials for 157-nm photoresists: characterization and properties.Proceedings of SPIE,3999
French, R. H., Francis Carcia, P. H., Hughes, G. H., Torardi, C. H., Reynolds, G. H., & Dieu, L. H.(1999).Thin Films for Phase-shift Masks.Vaccum and Thin Film.
French, R. H., Francis Carcia, P. H., Reynolds, G. H., Hughes, G. H., Torardi, C. H., Jones, D. H., & Dieu, L. H.(1999).Optical superlattices as phase-shift masks for microlithography.Proceedings of SPIE,3790
French, R. H., Reynolds, G. H., Francis Carcia, P. H., Torardi, C. H., Hughes, G. H., & Jones, D. H.(1998).{TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography.SPIE,3546
French, R. H., Müllejans, H. H., & Jones, D. H.(1998).Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging.Acta Materialia,46(7),2271-2287.
French, R. H., & Thiele, E. H.(1997).Computational Modeling of {TiO2} Particle Optics Using a Finite Element Method.Proceedings of the Paint Research Association.
French, R. H., & Müllejans, H. H.(1997).Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure.Proceedings of the Microscopy Society of America.
French, R. H., Johnson, R. H., & Thiele, E. H.(1997).Light-scattering efficiency of white pigments: an analysis of model core - shell pigments vs. optimized rutile {TiO2}.{TAPPI} Journal,80, 233-239.
French, R. H., Francis Carcia, P. H., & Jones, D. H.(1997).Optical superlattices—a strategy for designing phase-shift masks for photolithography at 248 and 193 nm: Application to {AlN/CrN}.Applied Physics Letters,70(18),2371-2373.
French, R. H., & Xu, Y. H.(1996).First-principles investigation of the optical properties of crystalline poly(di-n-hexylsilane).Physical Review B,54(19),13546-13550.
French, R. H., & Mo, S. H.(1996).Optical properties of a near-Sigma-11 a axis tilt grain boundary in alpha-Al2O3.Journal of Physics D: Applied Physics,29(7),1761-1766.
French, R. H., & Xu, Y. H.(1996).Critical point analysis of the interband transition strength of electrons.Journal of Physics D: Applied Physics,29(7),1740-1750.
French, R. H., & Müllejans, H. H.(1996).Interband electronic structure of a near- grain boundary in -alumina determined by spatially resolved valence electron energy-loss spectroscopy.Journal of Physics D: Applied Physics,29(7),1751-1760.
French, R. H., Ackler, H. H., & Chiang, Y. H.(1996).Comparisons of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties.Journal of Colloid and Interface Science,179(2),460-469.
French, R. H.(1995).Interfacial Electronic Structure and Full Spectral Hamaker Constants of {Si3N4} Intergranular Films from {VUV} and {SR-VEEL} Spectroscopy.Materials Research Society.
French, R. H., Wilson, S. H., Naqvi, S. H., McNeil, J. H., Marchman, H. H., Johs, B. H., & Kalk, F. H.(1995).Metrology of etched quartz and chrome embedded phase shift gratings using scatterometry.SPIE,2439
French, R. H.(1995). Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths.Solid State Ionics,75, 13-33.
