Publications
Tuesday, December 31, 1996
French, R. H.
(1996).
Materials Screening for Attenuating Embedded {Phase-Shift} Photoblanks for {DUV} and 193 nm Photolithography.
SPIE,
().
Friday, November 15, 1996
Sunday, December 31, 1995
French, R. H.
(1995).
Interfacial Electronic Structure and Full Spectral Hamaker Constants of {Si3N4} Intergranular Films from {VUV} and {SR-VEEL} Spectroscopy.
Materials Research Society,
().
Monday, May 22, 1995
French, R. H. , Wilson, S., Naqvi, S., McNeil, J., Marchman, H., Johs, B., ... Kalk, F.
(1995).
Metrology of etched quartz and chrome embedded phase shift gratings using scatterometry.
SPIE,
2439
().
DOI:
10.1117/12.209233
Tuesday, January 31, 1995
Saturday, December 31, 1994
French, R. H.
(1994).
Quantitative Electronic Structure Analysis of {a-Al2O3} Using Spatially Resolved Valence Electron {Energy-Loss} Spectra.
Mat. Res. Soc. Symp. Proc,
().
Wednesday, December 7, 1994
Wednesday, November 30, 1994
Friday, November 4, 1994
French, R. H. , Johs, B., Kalk, F., McGahan, W., & Woollam, J.
(1994).
Optical Analysis of Complex Multilayer Structures Using Multiple Data Types.
SPIE,
2253
().
DOI:
10.1117/12.192054
Thursday, November 3, 1994
Monday, February 28, 1994
Tuesday, February 15, 1994
Friday, December 31, 1993
French, R. H. , & Müllejans, H.
(1993).
Quantitative Electronic Structure Analysis of {a-Al2O3} Using Spatially Resolved Valence Energy-loss Spectra.
{IOP} Publishing,
().
Pages