{TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography Read more about {TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography
Quantitative analysis of valence electron energy-loss spectra of aluminium nitride Read more about Quantitative analysis of valence electron energy-loss spectra of aluminium nitride
Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging Read more about Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging
Computation of Light Scattering by Anisotropic Spheres of Rutile Titania Read more about Computation of Light Scattering by Anisotropic Spheres of Rutile Titania
{Kramers–Kronig} transform for the surface energy loss function Read more about {Kramers–Kronig} transform for the surface energy loss function
{Light-Scattering} Properties of Representative, Morphological Rutile Titania Particles Studied Using a {Finite-Element} Method Read more about {Light-Scattering} Properties of Representative, Morphological Rutile Titania Particles Studied Using a {Finite-Element} Method
Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron {Energy-Loss} Spectroscopies Read more about Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron {Energy-Loss} Spectroscopies
Optical properties and London dispersion interaction of amorphous and crystalline {SiO2} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry Read more about Optical properties and London dispersion interaction of amorphous and crystalline {SiO2} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry
Second generation fluids for 193nm immersion lithography Read more about Second generation fluids for 193nm immersion lithography
