{Light-Scattering} Properties of Representative, Morphological Rutile Titania Particles Studied Using a {Finite-Element} Method Read more about {Light-Scattering} Properties of Representative, Morphological Rutile Titania Particles Studied Using a {Finite-Element} Method
Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron {Energy-Loss} Spectroscopies Read more about Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron {Energy-Loss} Spectroscopies
Optical properties and London dispersion interaction of amorphous and crystalline {SiO2} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry Read more about Optical properties and London dispersion interaction of amorphous and crystalline {SiO2} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry
Second generation fluids for 193nm immersion lithography Read more about Second generation fluids for 193nm immersion lithography
Origins and Applications of London Dispersion Interactions in Polymers and Other Materials: Electronic Structure, Optical Properties and Chemistry Read more about Origins and Applications of London Dispersion Interactions in Polymers and Other Materials: Electronic Structure, Optical Properties and Chemistry
Nonadditivity in van der Waals interactions within multilayers Read more about Nonadditivity in van der Waals interactions within multilayers
Bis(fluoroalcohol) Monomers and Polymers: Improved Transparency Fluoropolymer Photoresists for Semiconductor Photolithography at 157 nm Read more about Bis(fluoroalcohol) Monomers and Polymers: Improved Transparency Fluoropolymer Photoresists for Semiconductor Photolithography at 157 nm
Optical superlattices as phase-shift masks for microlithography Read more about Optical superlattices as phase-shift masks for microlithography
Optical properties of {AlN} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry data Read more about Optical properties of {AlN} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry data
Tunneling spectroscopic analysis of optically active wide band‐gap semiconductors Read more about Tunneling spectroscopic analysis of optically active wide band‐gap semiconductors
