Indirect measurement methods for quality and process control in nanomanufacturing Read more about Indirect measurement methods for quality and process control in nanomanufacturing
Tensile strength prediction in directed energy deposition through physics-informed machine learning and Shapley additive explanations Read more about Tensile strength prediction in directed energy deposition through physics-informed machine learning and Shapley additive explanations
Light scattering from red pigment particles: Multiple scattering in a strongly absorbing system Read more about Light scattering from red pigment particles: Multiple scattering in a strongly absorbing system
Consequence of {Nanometer-Scale} Property Variations to Macroscopic Properties of {CrOCN} Thin Films Read more about Consequence of {Nanometer-Scale} Property Variations to Macroscopic Properties of {CrOCN} Thin Films
Bulk electronic structure of {SrTiO[sub} 3]: Experiment and theory Read more about Bulk electronic structure of {SrTiO[sub} 3]: Experiment and theory
157-nm imaging using thick single-layer resists Read more about 157-nm imaging using thick single-layer resists
Valence electron energy loss study of Fe-doped {SrTiO3} and a Σ13 boundary: electronic structure and dispersion forces Read more about Valence electron energy loss study of Fe-doped {SrTiO3} and a Σ13 boundary: electronic structure and dispersion forces
157-nm pellicles: polymer design for transparency and lifetime Read more about 157-nm pellicles: polymer design for transparency and lifetime
Behavior of candidate organic pellicle materials under 157-nm laser irradiation Read more about Behavior of candidate organic pellicle materials under 157-nm laser irradiation
Fluoropolymers for 157 nm Lithography: Performance of Single Layer Resists. Read more about Fluoropolymers for 157 nm Lithography: Performance of Single Layer Resists.
