Materials Science & Engineering Publications

Monday, November 1, 1999

Structure, Composition, and Bonding of Grain Boundaries in Metals

Ernst, F., Scheu, C., Schweinfest, R., & Rühle, M. (1999). Structure, Composition, and Bonding of Grain Boundaries in Metals. , ().

Thursday, September 30, 1999

Thin Films for Phase-shift Masks

French, R. H., Francis Carcia, P., Hughes, G., Torardi, C., Reynolds, G., & Dieu, L. (1999). Thin Films for Phase-shift Masks. Vaccum and Thin Film, ().

Wednesday, September 1, 1999

Interaction Between Point Defects and Dislocations in SiGe

Lyutovich, K., Ernst, F., Kasper, E., Bauer, M., & Oehme, M. (1999). Interaction Between Point Defects and Dislocations in SiGe. , ().

Wednesday, September 1, 1999

RelaxedSiGeBuffers with Thicknesses Below 0.1Micron

Bauer, M., Lyutovich, K., Oehme, M., Kasper, E., Herzog, H., & Ernst, F. (1999). RelaxedSiGeBuffers with Thicknesses Below 0.1Micron. , ().

Wednesday, June 30, 1999

Optical superlattices as phase-shift masks for microlithography

French, R. H., Francis Carcia, P., Reynolds, G., Hughes, G., Torardi, C., Jones, D., ... Dieu, L. (1999). Optical superlattices as phase-shift masks for microlithography. Proceedings of SPIE, 3790 ().
DOI: 10.1117/12.351257

Tuesday, January 26, 1999

Computation of Light Scattering by Anisotropic Spheres of Rutile Titania

French, R. H., & Thiele, E. (1999). Computation of Light Scattering by Anisotropic Spheres of Rutile Titania. Advanced Materials, 10 (15), 1271-1276.
DOI: 10.1002/(SICI)1521-4095(199810)10:15%3C1271::AID-ADMA1271%3E3.0.CO;2-C

Friday, January 1, 1999

C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures

Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F. (1999). C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures. , 79 ().

Friday, January 1, 1999

Synthesizing Boron Nitride Nanotubes Filled with SiC Nanowires by Using Carbon Nanotubes as Templates

Han, W., Redlich, P., Ernst, F., & Rühle, M. (1999). Synthesizing Boron Nitride Nanotubes Filled with SiC Nanowires by Using Carbon Nanotubes as Templates. Applied Physics Letters, 75 (), 1875–1877.

Friday, January 1, 1999

Correlated SiGe Wires Shaped by Regular Step Bunches on Miscut Si(113) Substrates

Brunner, K., Abstreiter, G., Kienzle, O., Ernst, F., & Rühle, M. (1999). Correlated SiGe Wires Shaped by Regular Step Bunches on Miscut Si(113) Substrates. Physical Review B, 60 (), 10935–10940.

Friday, January 1, 1999

Critical Thickness Reduction in Stacked Layers of Vertically Aligned Stranski–Krastanov Grown Islands

Schmidt, O., Kienzle, O., Schuler, H., Zundel, M., Lange, C., Eberl, K., ... Hao, Y. (1999). Critical Thickness Reduction in Stacked Layers of Vertically Aligned Stranski–Krastanov Grown Islands. Physical Review Letters, (), Submitted.

Friday, January 1, 1999

Formation of (BN)xCy and BN Nanotubes Filled with Boron Carbide Nanowires

Han, W., Redlich, P., Ernst, F., & Rühle, M. (1999). Formation of (BN)xCy and BN Nanotubes Filled with Boron Carbide Nanowires. Chemistry of Materials, 11 (), 3620–3623.

Friday, January 1, 1999

Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening

Kienzle, O., Ernst, F., Rühle, M., Schmidt, O., & Eberl, K. (1999). Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening. Applied Physics Letters, 74 (), 269–271.

Friday, January 1, 1999

High-Precision Assessment of Interface Lattice Offset by Quantitative HRTEM

Schweinfest, R., Ernst, F., Wagner, T., & Rühle, M. (1999). High-Precision Assessment of Interface Lattice Offset by Quantitative HRTEM. Journal of Microscopy, 194 (), 142–151.

Friday, January 1, 1999

Interaction Between Point Defects and Dislocations in SiGe

Lyutovich, K., Ernst, F., Kasper, E., Bauer, M., & Oehme, M. (1999). Interaction Between Point Defects and Dislocations in SiGe. Solid State Phenomena, 69–79 (), 179–184.

Friday, January 1, 1999

Micromechanisms of Fracture in NiAl, Studied by in situ HVEM

Baither, D., Ernst, F., Wagner, T., Rühle, M., Bartsch, M., & Messerschmidt, U. (1999). Micromechanisms of Fracture in NiAl, Studied by in situ HVEM. Intermetallics, 9 (), 479–489.

Friday, January 1, 1999

Modified Stranski–Krastanov Growth in Stacked Layers of Self-Assembled Islands

Schmidt, O., Kienzle, O., Hao, Y., Eberl, K., & Ernst, F. (1999). Modified Stranski–Krastanov Growth in Stacked Layers of Self-Assembled Islands. Applied Physics Letters, 74 (), 1272–1274.

Friday, January 1, 1999

Nanomechanical Modeling of Misfit Dislocations at Heterointerfaces

Ernst, F., Nataraj, R., & Rühle, M. (1999). Nanomechanical Modeling of Misfit Dislocations at Heterointerfaces. Zeitschrift für Metallkunde, 90 (), 961–977.

Friday, January 1, 1999

Phase Segregation, Cu Migration, and Junction Formation in Cu(In,Ga)Se2

Herberholz, R., Rau, U., Schock, H., Haalboom, T., Gödecke, T., Ernst, F., ... Cahen, D. (1999). Phase Segregation, Cu Migration, and Junction Formation in Cu(In,Ga)Se2. European Physical Journal– Applied Physics, 6 (), 131–139.

Friday, January 1, 1999

Preparation and Optical Properties of Ge and C-induced Ge Dots on Si

Eberl, K., Schmidt, O., Kienzle, O., & Ernst, F. (1999). Preparation and Optical Properties of Ge and C-induced Ge Dots on Si. Materials Research Society, 570 (), 187-195.

Friday, January 1, 1999

Self-Assembling Si/SiGe Nanostructures for Light Emitters

Eberl, K., Schmidt, O., Kienzle, O., & Ernst, F. (1999). Self-Assembling Si/SiGe Nanostructures for Light Emitters. Diffusion & Defect Data B: Solid State Phenomena, 69–70 (), 13–21.

Friday, January 1, 1999

Special Issue

Ernst, F., Mayer, J., & Rühle, M. (1999). Special Issue. Journal of Microscopy, 194 ().

Friday, January 1, 1999

Structural Investigation of Si/SiGe Superlattices on Vicinal (113) Oriented Si

Stangl, J., Holy, V., Grim, J., Bauer, G., Brunner, K., Abstreiter, G., ... Ernst, F. (1999). Structural Investigation of Si/SiGe Superlattices on Vicinal (113) Oriented Si. Thin Solid Films, 357 (), 71–75.

Friday, January 1, 1999

Structure and Composition of Grain Boundaries in Ceramics

Ernst, F., Kienzle, O., & Rühle, M. (1999). Structure and Composition of Grain Boundaries in Ceramics. Journal of the European Ceramic Society, 19 (), 665–673.

Friday, December 18, 1998

{TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography

French, R. H., Reynolds, G., Francis Carcia, P., Torardi, C., Hughes, G., & Jones, D. (1998). {TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography. SPIE, 3546 ().
DOI: 10.1117/12.332857

Saturday, August 1, 1998

Regular Step Bunching and Ordering of Ge Islands on Vicinal Si Surfaces

Brunner, K., Abstreiter, G., Kienzle, O., & Ernst, F. (1998). Regular Step Bunching and Ordering of Ge Islands on Vicinal Si Surfaces. , ().

Case School of Engineering

Materials Science & Engineering

Materials Science & Engineering Publications

Structure, Composition, and Bonding of Grain Boundaries in Metals

Thin Films for Phase-shift Masks

Interaction Between Point Defects and Dislocations in SiGe

RelaxedSiGeBuffers with Thicknesses Below 0.1Micron

Optical superlattices as phase-shift masks for microlithography

Computation of Light Scattering by Anisotropic Spheres of Rutile Titania

C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures

Synthesizing Boron Nitride Nanotubes Filled with SiC Nanowires by Using Carbon Nanotubes as Templates

Correlated SiGe Wires Shaped by Regular Step Bunches on Miscut Si(113) Substrates

Critical Thickness Reduction in Stacked Layers of Vertically Aligned Stranski–Krastanov Grown Islands

Formation of (BN)xCy and BN Nanotubes Filled with Boron Carbide Nanowires

Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening

High-Precision Assessment of Interface Lattice Offset by Quantitative HRTEM

Interaction Between Point Defects and Dislocations in SiGe

Micromechanisms of Fracture in NiAl, Studied by in situ HVEM

Modified Stranski–Krastanov Growth in Stacked Layers of Self-Assembled Islands

Nanomechanical Modeling of Misfit Dislocations at Heterointerfaces

Phase Segregation, Cu Migration, and Junction Formation in Cu(In,Ga)Se2

Preparation and Optical Properties of Ge and C-induced Ge Dots on Si

Self-Assembling Si/SiGe Nanostructures for Light Emitters

Special Issue

Structural Investigation of Si/SiGe Superlattices on Vicinal (113) Oriented Si

Structure and Composition of Grain Boundaries in Ceramics

{TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography

Regular Step Bunching and Ordering of Ge Islands on Vicinal Si Surfaces

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