The importance of being positive in causal statistical fault localization: important properties of Baah et al.'s csfl regression model Read more about The importance of being positive in causal statistical fault localization: important properties of Baah et al.'s csfl regression model
Sampling code clones from program dependence graphs with GRAPLE Read more about Sampling code clones from program dependence graphs with GRAPLE
Properties of Effective Metrics for Coverage-Based Statistical Fault Localization Read more about Properties of Effective Metrics for Coverage-Based Statistical Fault Localization
Causal inference based fault localization for numerical software with NUMFL Read more about Causal inference based fault localization for numerical software with NUMFL
Deformation slip and twinning in bulk and nanocrystalline semiconductors Read more about Deformation slip and twinning in bulk and nanocrystalline semiconductors
Degradation of SiC Bipolar Devices: A Review of Likely Causes and Recent Advances in its Understanding Read more about Degradation of SiC Bipolar Devices: A Review of Likely Causes and Recent Advances in its Understanding
The concept of quasi-Fermi level and expansion of faulted loops in SiC under minority carrier injection Read more about The concept of quasi-Fermi level and expansion of faulted loops in SiC under minority carrier injection
On phase transformations in a Ni-based superalloy Read more about On phase transformations in a Ni-based superalloy
Defect reduction in heteroepitaxial InP on Si by epitaxial lateral overgrowth Read more about Defect reduction in heteroepitaxial InP on Si by epitaxial lateral overgrowth
