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Impact of environmental variables on the degradation of photovoltaic components and perspectives for the reliability assessment methodology

  • Read more about Impact of environmental variables on the degradation of photovoltaic components and perspectives for the reliability assessment methodology

Characterizing photovoltaic backsheet adhesion degradation using the wedge and single cantilever beam tests, Part II: Accelerated tests

  • Read more about Characterizing photovoltaic backsheet adhesion degradation using the wedge and single cantilever beam tests, Part II: Accelerated tests

Spatially resolved characterization of optical and recombination losses for different industrial silicon solar cell architectures

  • Read more about Spatially resolved characterization of optical and recombination losses for different industrial silicon solar cell architectures

Characterizing photovoltaic backsheet adhesion degradation using the wedge and single cantilever beam tests, Part I: Field Modules

  • Read more about Characterizing photovoltaic backsheet adhesion degradation using the wedge and single cantilever beam tests, Part I: Field Modules

Data-driven evaluation of HVAC operation and savings in commercial buildings

  • Read more about Data-driven evaluation of HVAC operation and savings in commercial buildings

Resonant Nanoelectromechanical Systems (NEMS): Progress and Emerging Frontiers

  • Read more about Resonant Nanoelectromechanical Systems (NEMS): Progress and Emerging Frontiers

Black Phosphorus NEMS Resonant Infrared (IR) Detector

  • Read more about Black Phosphorus NEMS Resonant Infrared (IR) Detector

Beta Gallium Oxide (ß-Ga 2 O 3 ) Vibrating Channel Transistor

  • Read more about Beta Gallium Oxide (ß-Ga 2 O 3 ) Vibrating Channel Transistor

Controlling Polarity of MoTe 2 Transistors for Monolithic Complementary Logic via Schottky Contact Engineering

  • Read more about Controlling Polarity of MoTe 2 Transistors for Monolithic Complementary Logic via Schottky Contact Engineering

Determination of Elastic Modulus of Silicon Carbide (SiC) Thin Diaphragms via Mode-Dependent Duffing Nonlinear Resonances

  • Read more about Determination of Elastic Modulus of Silicon Carbide (SiC) Thin Diaphragms via Mode-Dependent Duffing Nonlinear Resonances

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Case School of Engineering
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Nord Hall
2095 Martin Luther King Jr Dr
Rm 500
Cleveland, OH 44106

Mailing Address:
10900 Euclid Ave.
Cleveland, Ohio 44106-7148

Phone: 216.368.4436

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