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Time-Domain AC Measurement of SiC Nanoelectromechanical Switches toward High Speed Operations

  • Read more about Time-Domain AC Measurement of SiC Nanoelectromechanical Switches toward High Speed Operations

Time-domain AC characterization of silicon carbide (SiC) nanoelectromechanical switches toward high-speed operations

  • Read more about Time-domain AC characterization of silicon carbide (SiC) nanoelectromechanical switches toward high-speed operations

Silicon carbide (SiC) nanoelectromechanical switches and logic gates with long cycles and robust performance in ambient air and at high temperature

  • Read more about Silicon carbide (SiC) nanoelectromechanical switches and logic gates with long cycles and robust performance in ambient air and at high temperature

Robust silicon carbide (SiC) nanoelectromechanical switches with long cycles in ambient and high temperature conditions

  • Read more about Robust silicon carbide (SiC) nanoelectromechanical switches with long cycles in ambient and high temperature conditions

Robust Silicon Carbide (SiC) Nanoelectromechanical Switches with Long Cycles in Ambient and High Temperature Conditions

  • Read more about Robust Silicon Carbide (SiC) Nanoelectromechanical Switches with Long Cycles in Ambient and High Temperature Conditions

Nanomechanical non-volatile memory for computing at extreme

  • Read more about Nanomechanical non-volatile memory for computing at extreme

Dual-gate silicon carbide (SiC) lateral nanoelectromechanical switches

  • Read more about Dual-gate silicon carbide (SiC) lateral nanoelectromechanical switches

Dual-gate silicon carbide (SiC) lateral nanoelectromechanical switches

  • Read more about Dual-gate silicon carbide (SiC) lateral nanoelectromechanical switches

Secure and Trusted SoC: Challenges and Emerging Solutions

  • Read more about Secure and Trusted SoC: Challenges and Emerging Solutions

VL-ECC: Variable Data-Length Error Correction Code for Embedded Memory in DSP Applications

  • Read more about VL-ECC: Variable Data-Length Error Correction Code for Embedded Memory in DSP Applications

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Case School of Engineering
Campus Location:
Nord Hall
2095 Martin Luther King Jr Dr
Rm 500
Cleveland, OH 44106

Mailing Address:
10900 Euclid Ave.
Cleveland, Ohio 44106-7148

Phone: 216.368.4436

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