High-Precision Assessment of Interface Lattice Offset by Quantitative HRTEM Read more about High-Precision Assessment of Interface Lattice Offset by Quantitative HRTEM
Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening Read more about Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening
Formation of (BN)xCy and BN Nanotubes Filled with Boron Carbide Nanowires Read more about Formation of (BN)xCy and BN Nanotubes Filled with Boron Carbide Nanowires
Critical Thickness Reduction in Stacked Layers of Vertically Aligned Stranski–Krastanov Grown Islands Read more about Critical Thickness Reduction in Stacked Layers of Vertically Aligned Stranski–Krastanov Grown Islands
Correlated SiGe Wires Shaped by Regular Step Bunches on Miscut Si(113) Substrates Read more about Correlated SiGe Wires Shaped by Regular Step Bunches on Miscut Si(113) Substrates
C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures Read more about C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures
Progress in Structure Analysis of Crystal Defects by Quantitative HRTEM Read more about Progress in Structure Analysis of Crystal Defects by Quantitative HRTEM
Fully Relaxed Si0.7Ge0.3 Buffers Grown on Patterned Silicon Substrates for Hetero-CMOS Transistors Read more about Fully Relaxed Si0.7Ge0.3 Buffers Grown on Patterned Silicon Substrates for Hetero-CMOS Transistors
Vertical Correlation of SiGe Islands in SiGe–Si Superlattices: X-ray Diffraction Versus Transmission Electron Microscopy Read more about Vertical Correlation of SiGe Islands in SiGe–Si Superlattices: X-ray Diffraction Versus Transmission Electron Microscopy