Measurement of Tridentate Astigmatism of a Conventional HRTEM and a high-vacuum HRTEM Read more about Measurement of Tridentate Astigmatism of a Conventional HRTEM and a high-vacuum HRTEM
Interface Dislocations Forming in GeSi Layers During Epitaxy on {111} Si Substrates at High Temperatures Read more about Interface Dislocations Forming in GeSi Layers During Epitaxy on {111} Si Substrates at High Temperatures
Hochauflösende Elektronenmikroskopie der Entmischung von Al– 1 at% Ag at 413K (Decomposition Kinetics of Al–1 at% Ag at 413K, Studied by High-Resolution Electron Microscopy) Read more about Hochauflösende Elektronenmikroskopie der Entmischung von Al– 1 at% Ag at 413K (Decomposition Kinetics of Al–1 at% Ag at 413K, Studied by High-Resolution Electron Microscopy)
Formation of Carbon-Induced Germanium Dots Read more about Formation of Carbon-Induced Germanium Dots
Effect of Shear Stress on the Atomistic Structure of a Grain Boundary in Strontium Titanate Read more about Effect of Shear Stress on the Atomistic Structure of a Grain Boundary in Strontium Titanate
Determining Periodicities at Grain Boundaries in HRTEM Read more about Determining Periodicities at Grain Boundaries in HRTEM
Defect Distribution in Compositionally-Graded EpitaxialSiGeLayers on Si Substrates Read more about Defect Distribution in Compositionally-Graded EpitaxialSiGeLayers on Si Substrates
Atomistische Struktur von Korngrenzen in -Al2O3 Read more about Atomistische Struktur von Korngrenzen in -Al2O3
Atomistic Structure of Al/MgAl2O4 Interfaces Read more about Atomistic Structure of Al/MgAl2O4 Interfaces
Atomic-Resolution Transmission Electron Microscopy– Present State and Future Perspectives Read more about Atomic-Resolution Transmission Electron Microscopy– Present State and Future Perspectives
