EECS500 Spring 2016 Department Colloquium

Robert Gao
Process-Embedded Sensing for Smart Manufacturing
White 411
March 31, 2016

With the increasing convergence of measurement science, computational intelligence, wireless communication, and system miniaturization, sensing has continually improved the observability in manufacturing, providing the physical foundation for online process control and quality assessment.

This seminar highlights research conducted in the Electromechanical Systems Laboratory, in
the area of process-embedded sensing for improving the observability in manufacturing process monitoring and control, using polymer injection molding and sheet metal forming as examples. The design, characterization, and realization of sensing-enabled smart tooling and acoustic-based wireless data transmission in electromagnetically shielded environment are demonstrated. The presentation demonstrates the potential of integrating sensing with data analytics for advancing the science base for manufacturing.


Robert Gao is the Cady Staley Professor and Department Chair of Mechanical and Aerospace Engineering at the Case Western Reserve University in Cleveland, Ohio. Since receiving his Ph.D. from the Technical University of Berlin, Germany in 1991, he has been working on physics-based sensing methodology, design, modeling, and characterization of instrumentation systems, multi-resolution signal analysis, and energy-efficient sensor networks for improving the observability of systems and processes being monitored to understand the underlying physical mechanisms.

Prof. Gao is a Fellow of the IEEE, SME, and ASME, a Distinguished Lecturer of the IEEE Instrumentation and Measurement Society, and a Corresponding Member of the Connecticut
Academy of Science and Engineering. He served as an Associate Editor for the ASME Journal of Manufacturing Science and Engineering, ASME Journal of Dynamic Systems, Measurement, and Control, IFAC Journal of Mechatronics, and IEEE Transactions on Instrumentation and Measurement. He is a recipient of multiple honors and awards, including the IEEE Instrumentation and Measurement Society’s Technical Award, several Best Paper and Best Student Paper awards, Outstanding Junior and Senior Faculty awards, Research Excellence award, and an NSF CAREER award.