Chris Zorman Inducted Into 2017 AVS Class of Fellows

On November 1, Professor Chris Zorman was officially inducted into the 2017 Class of Fellows in the AVS.  "For pioneering work in the development of chemical vapor deposition techniques and mechanical characterization of silicon carbide thin films critical to the development of harsh environment MEMS."

Professor Zorman is also currently serving as a Senior Editor for IEEE Sensors Letters and was part of the inaugural group of senior editors.