SCSAM has three surface analysis instruments for Auger spectroscopy, X-ray photoelectron spectroscopy (also known as electron spectroscopy for chemical analysis), and time-of-flight secondary ion mass spectroscopy.
PHI 680 Scanning Auger Microprobe
PHI Versaprobe 5000 X-ray Photoelectron Spectroscopy/ESCA
PHI TRIFT V nanoTOF Time of Flight Secondary Ion Mass Spectrometer (TOF-SIMS)
News and events:
Microscopy in the News
Sign up for access to the SCSAM Online Scheduler
Contact Sharon Dingess (email@example.com) or 216-368-3868 for assistance with using the Scheduler.
Join our LinkedIn group to follow news feeds!