Center for Surface Analysis of Materials
2016 Fall Break 1-Day Short Course
Structural & Compositional Analysis Solutions
Who should attend this course ?
Graduate students, post-doctoral fellows, faculty,
and anyone interested in microscopy, diffraction,
and surface analysis.
Monday - October 24 - White 411
Morning Session 9:00-12:00PM
Dr. A. Avishai – Introduction
Dr. W. Jennings – Auger Electron Spectroscopy
Dr. K. Abbasi – X-Ray Photoelectron Spectroscopy
--Time of Flight Secondary Ion Mass Spectroscopy
Dr. J. Cowen – X-Ray Diffraction
Refreshments will be served at lunch break.
Afternoon Session 1:00-5:00PM
Ms. N. Avishai – Scanning Electron Microscopy
Dr. A. Avishai – Energy Dispersive Spectroscopy
--Electron Backscattered Diffraction
-- Focused Ion Beam
Dr. D. Wang – Transmission Electron Microscopy
--Electron Energy Loss Spectroscopy
Mr. R. Tomazin – AFM and Nanoindentation
The Swagelok Center for Surface Analysis of Materials provides:
* access to high-end analytical equipment.
* expert staff support. Access to vendor support.
* training – equipment operation and data analysis.
* tailoring solutions to be applied in research and industrial settings.
* methods and expertise development.
We are one part of the larger CWRU Service Center Group, serving as an extension of research and industrial lab infrastructures. Contact us to learn how we can meet your needs or to discuss parnership opportunities.
Please register for the course by emailing Sharon Dingess at email@example.com.
Use “2016 registration for SCSAM 1-day Short Course” in the subject line.
The Swagelok Center for Surface Analysis of Materials invites you to a special presentation by
EM/HIM/XRM Specialist, Carl Zeiss Microscopy
Tuesday, Sep 13, 2016--White 408
Followed by Open Discussion
3D X-ray Tomography – Material and Life Science Microscopy Applications
ZEISS Microscopy has a uniquely broad product portfolio including Light, X-Ray, and Electron Microscopes. Today’s presentation will explore the wide variety of Material and Life Science applications using X-Ray Microscopy. ZEISS Xradia X-ray Microscopes brings nondestructive synchrotron capabilities to the lab, while offering the industry best resolution and contrast.
2 & 3‐Dimensional Characterization of Soft and Porous Materials using DualBeam FIB‐SEM
October 20, 2015
Thin Film Analysis by EDS (LayerProbe)
November 4, 2015
SCSAM hosted two information and training events during Fall Semester 2014. We hope to continue this learning initiative, keeping our academic and industrial clients informed and aware of the latest techniques for research and real-world problem solving.
EBSD Special Training Session
Decmeber 11, 2014
Scott Sitzman from Oxford Instruments presented a Special Technique Training Session.
Fall Break Short Course
October 27-28, 2014
The Fall Break Short Course was a huge success with 111 participants from industry and academia over two days. See course statistics here.
Download Short Course Presentations.
Short Course Intro
How to Approach SEM and EDS Analysis
Introduction to FIB
Transmission Electron Microscopy