Hutt, S., Kienzle, O., Ernst, F., & Rühle, M.(2001).Processing and Structure of Grain Boundaries in Strontium Titanate.Zeitschrift für Metallkunde,92, 105–109.
Schmidt, O., Denker, U., Eberl, K., Kienzle, O., Ernst, F., & Haug, R.(2001).Resonant Tunneling Diodes Based on Stacked Self-Assembled Ge/Si Islands.Applied Physics Letters,77, 4341–4343.
Ernst, F., Mulvihill, M., Kienzle, O., & Rühle, M.(2001).Preferred Grain Orientation Relationships in Sintered Perovskite Ceramics.Journal of the American Ceramic Society,84, 1885–1890.
Brunner, K., Abstreiter, G., Kienzle, O., & Ernst, F.(2001).Self-Ordering of Ge Islands on Si Substrates Mediated by Local Strain Fields.Physica Status Solidi (b),224, 531–535.
Schmidt, O., Denker, U., Eberl, K., Kienzle, O., & Ernst, F.(2000).Effect of Overgrowth Temperature on the Photoluminescence of Ge/Si Islands.Applied Physics Letters,77, 2509–2511.
Schmidt, O., Eberl, K., Kienzle, O., Ernst, F., Christiansen, S., & Strunk, H.(2000).Reduced Critical Thickness and Photoluminescence Line Splitting in Multiple Layers of Self-Assembled Ge/Si Islands.Materials Science and Engineering B,74, 248–252.
Brunner, K., Zhou, J., Abstreiter, G., Kienzle, O., & Ernst, F.(2000).Step Bunching and Correlated SiGe Nanostructures on Si(113).Thin Solid Films,369, 39–42.
Eberl, K., Schmidt, O., Kienzle, O., & Ernst, F.(2000).Preparation and Optical Properties of Ge and C-induced Ge Dots on Si.Thin Solid Films,373, 164-169.
Eberl, K., Schmidt, O., Duschl, R., Kienzle, O., Ernst, F., & Rau, Y.(2000).Self-Assembling SiGe and SiGeC Nanostructures for Light Emitters and Tunneling Diodes.Thin Solid Films,369, 33–38.
Stangl, J., Roch, T., Bauer, G., Kegel, I., Metzger, T., Schmidt, O., Eberl, K., Kienzle, O., & Ernst, F.(2000).Vertical Correlation of SiGe Islands in SiGe–Si Superlattices: X-ray Diffraction Versus Transmission Electron Microscopy.Applied Physics Letters,77, 3953-3955.
Eberl, K., Schmidt, O., Kienzle, O., & Ernst, F.(2000).Preparation and Optical Properties of Ge and C-induced Ge Dots on Si.Mat. Res. Soc. Sym. Proc.,571, 355–362.
Brunner, K., Miesner, C., Abstreiter, G., Kienzle, O., & Ernst, F.(2000).Self-Organized Periodic Arrays of SiGe Wires and Ge Islands on Miscut Si Substrates.Physica A,7, 881–886.
Schmidt, O., Kienzle, O., Schuler, H., Zundel, M., Lange, C., Eberl, K., Ernst, F., & Hao, Y.(1999).Critical Thickness Reduction in Stacked Layers of Vertically Aligned Stranski–Krastanov Grown Islands.Physical Review Letters.
Eberl, K., Schmidt, O., Kienzle, O., & Ernst, F.(1999).Self-Assembling Si/SiGe Nanostructures for Light Emitters.Diffusion & Defect Data B: Solid State Phenomena,69–70, 13–21.
Kienzle, O., Ernst, F., Rühle, M., Schmidt, O., & Eberl, K.(1999).Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening.Applied Physics Letters,74, 269–271.
Stangl, J., Holy, V., Grim, J., Bauer, G., Brunner, K., Abstreiter, G., Kienzle, O., & Ernst, F.(1999).Structural Investigation of Si/SiGe Superlattices on Vicinal (113) Oriented Si.Thin Solid Films,357, 71–75.
Brunner, K., Abstreiter, G., Kienzle, O., Ernst, F., & Rühle, M.(1999).Correlated SiGe Wires Shaped by Regular Step Bunches on Miscut Si(113) Substrates.Physical Review B,60, 10935–10940.
Schmidt, O., Kienzle, O., Hao, Y., Eberl, K., & Ernst, F.(1999).Modified Stranski–Krastanov Growth in Stacked Layers of Self-Assembled Islands.Applied Physics Letters,74, 1272–1274.
Ernst, F., Kienzle, O., & Rühle, M.(1999).Structure and Composition of Grain Boundaries in Ceramics.Journal of the European Ceramic Society,19, 665–673.
Kienzle, O., Exner, M., & Ernst, F.(1998).Atomistic Structure of =3, (111) Grain Boundaries in Strontium Titanate.Physica Status Solidi (a),166, 57–71.
Wöhl, G., Schöllhorn, C., Schmidt, O., Brunner, K., Eberl, K., Kienzle, O., & Ernst, F.(1998).Characterization of Self-Assembled Ge Islands on Si (100) by Atomic Force Microscopy and Transmission Electron Microscopy.Thin Solid Films,321, 86–91.
Kienzle, O., Ernst, F., & Mobus, G.(1998).Reliability of Atom Column Positions in a Ternary System Determined by Quantitative High-Resolution Transmission Electron Microscopy.Journal of Microscopy,190, 144–158.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures.Thin Solid Films,336, 248–251.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).Influence of Pre-Grown Carbon on the Formation of Germanium Dots.Thin Solid Films,321, 70–75.
Brunner, K., Abstreiter, G., Kienzle, O., & Ernst, F.(1998).Lateral Ordering of Self-Assembled Ge Islands.Thin Solid Films,336, 252–255.
Kienzle, O., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative HRTEM.Journal of Computer-Assisted Microscopy,9, 13–15.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1997).Formation of Carbon-Induced Germanium Dots.Applied Physics Letters,71, 2340–2342.
Kienzle, O., Ernst, F., & Rühle, M.(1997).Atomic-Resolution Transmission Electron Microscopy– Present State and Future Perspectives.Acta Microscopica,6, 36–39.
Kienzle, O., & Ernst, F.(1997).TEM Analysis of GeSi Quantum Point Structures.European Journal of Cell Biology,74, 52-52.
Ernst, F., Kienzle, O., & Exner, M.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy.,466, 95–106.
Kienzle, O., & Ernst, F.(1997).Effect of Shear Stress on the Atomistic Structure of a Grain Boundary in Strontium Titanate.Journal of the American Ceramic Society,80, 1639–1644.
