Justin S. Fada

Publications

Karimi, A., Fada, J., Parrilla, N., Pierce, B., Koyutürk, M., French, R. H., & Braid, J. H. (2020). Generalized and Mechanistic PV Module Performance Prediction From Computer Vision and Machine Learning on Electroluminescence Images. IEEE Journal of Photovoltaics, 10 (3), 878-887.
Karimi, A., Fada, J., Parrilla, N., Pierce, B., Koyut\"urk, Mehmet, B., & Braid, J. (2020). Generalized and Mechanistic PV Module Performance Prediction From Computer Vision and Machine Learning on Electroluminescence Images. IEEE Journal of Photovoltaics, 10 (3), 878--887.
Karimi, A., Fada, J., Hossain, M., Yang, S., Peshek, T., Braid, J., & French, R. H. (2019). Automated Pipeline for Photovoltaic Module Electroluminescence Image Processing and Degradation Feature Classification. IEEE Journal of Photovoltaics, 9 (5), 1324-1335.
Karimi, A., Fada, J., Hossain, M., Yang, S., Peshek, T., \customboldJennifer L. Braid, T., & French, R. H. (2019). Automated Pipeline for Photovoltaic Module Electroluminescence Image Processing and Degradation Feature Classification. IEEE Journal of Photovoltaics.
Karimi, A., Fada, J., Hossaine, M., Yang, S., Peshek, T., & Braid, J. (2019). Automated Pipeline for Photovoltaic Module Electroluminescence Image Processing and Degradation Feature Classification. IEEE JOURNAL OF PHOTOVOLTAICS, 9 (5), 1324-1335.
Karimi, A., Fada, J., Hossain, M., Yang, S., Peshek, T., & Braid, J. (2019). Automated Pipeline for Photovoltaic Module Electroluminescence Image Processing and Degradation Feature Classification. IEEE Journal of Photovoltaics.
Fada, J., Wheeler, N., Zabiyaka, D., Goel, N., Peshek, T., & French, R. H. (2016). Democratizing an electroluminescence imaging apparatus and analytics project for widespread data acquisition in photovoltaic materials. Review of Scientific Instruments [00346748], 87 (8).
Peshek, T., Fada, J., Hu, Y., Xu, Y., Elsaeiti, M., Schnabel, E., Köhl, M., & French, R. H. (2016). Insights into metastability of photovoltaic materials at the mesoscale through massive I–V analytics. Journal of Vacuum Science and Technology B Microelectronics and Nanometer Structures [21662746], 34 (5).