Stangl, J., Roch, T., Bauer, G., Kegel, I., Metzger, T., Schmidt, O., Eberl, K., Kienzle, O., & Ernst, F. (2000). Vertical Correlation of SiGe Islands in SiGe–Si Superlattices: X-ray Diffraction Versus Transmission Electron Microscopy. Applied Physics Letters, 77 , 3953-3955.
