Amber N. Reed

Publications

Slipchenko, M., Jia, H., Liao, Y., Pashaei, V., Arutt, C., McCurdy, M., Zorman, C., Reed, A., Schrimpf, R., & Alles, M. (2019). Probing Heavy Ion Radiation Effects in Silicon Carbide (SiC) via 3D Integrated Multimode Diaphragms. Applied Physics Letters.
Altfeder, I., Lee, H., Hu, J., Naguy, R., Sehirlioglu, A., Reed, A., Voevodin, A., & Eom, C. (2016). Scanning tunneling microscopy of an interfacial two-dimensional electron gas in oxide heterostructures. Physical Review B [10980121], 93 (11).