Journal Articles and Proceedings

Rajter, RF, French RH, Ching WY, Podgornik R, Parsegian AV.  2013.  Chirality-dependent properties of carbon nanotubes: electronic structure, optical dispersion properties, Hamaker coefficients and van der Waals–London dispersion interactions. RSC Advances.

 

Bruckman, L.S., Wheeler, N.R., Kidd, I.V., Sun, J., French, R.H., 2013. Photovoltaic lifetime and degradation science statistical pathway development: acrylic degradation. p. 88250D–88250D–8. doi:10.1117/12.2024717

 

Wheeler, N.R., Bruckman, L.S., Ma, J., Wang, E., Wang, C.K., Chou, I., Sun, J., French, R.H., 2013. Statistical and domain analytics for informed study protocols, in: 2013 IEEE Energytech. Presented at the 2013 IEEE Energytech, pp. 1–7. doi:10.1109/EnergyTech.2013.6645354

 

Bruckman, L.S., Wheeler, N.R., Ma, J., Wang, E., Wang, C.K., Chou, I., Sun, J., French, R.H., 2013. Statistical and Domain Analytics Applied to PV Module Lifetime and Degradation Science. IEEE Access 1, 384–403. doi:10.1109/ACCESS.2013.2267611

 

Hu, Y., Hollingshead, D., Hossain, M.A., Schuetz, M., French, R., 2013. Comparison of multi-crystalline silicon PV modules’ performance under augmented solar irradiation. MRS Online Proceedings Library 1493, 3–9. doi:10.1557/opl.2013.221

2012

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Murray, MP, Bruckman LS, French RH.  2012.  Photodegradation in a stress and response framework: polymethyl methacrylate for solar mirrors and lens. Journal of Photonics for Energy.

 

Murray, MP, Bruckman LS, Gordon D, Richardson S, Reinbolt G, Schuetz M, French RH.  2012.  Degradation of back surface acrylic mirrors for low concentration and mirror-augmented photovoltaics. Reliability of Photovoltaic Cells, Modules, Components, and Systems V

 

Murray, MP, Bruckman LS, French RH.  2012.  Durability of Acrylic: Stress and Response Characterization of Materials for Photovoltaics. IEEE EnergyTech 2012.

 

Murray, MP, Bruckman LS, French RH.  2012.  Durability of Materials in a Stress-Response Framework: Acrylic Materials for Photovoltaic Systems.

 

 

Schuetz, M.A., Shell, K.A., Brown, S.A., Reinbolt, G.S., French, R.H., Davis, R.J., 2012. Design and Construction of a 7X Low-Concentration Photovoltaic System Based on Compound Parabolic Concentrators. Photovoltaics, IEEE Journal of 2, 382 –386. doi:10.1109/JPHOTOV.2012.2186283

 

USDOE.  2012.  From Quanta to the Continuum: Opportunities for Mesoscale Science.

 

Lin, W-C, Hollingshead D, Shell KA, Karas J, Brown SA, Schuetz M, Hu Y, French RH.  2012.  Mirror-Augmented Photovoltaic Designs and Performance.

 

2011

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French, RH, Rodríguez-Parada JM, Yang MK, Derryberry RA, Pfeiffenberger NT.  2011.  Optical properties of polymeric materials for concentrator photovoltaic systems. Solar Energy Materials and Solar Cells. 95:2077–2086.

 

Shell, KA, Brown SA, Schuetz MA, Davis RJ, French RH.  2011.  Design and performance of a low-cost acrylic reflector for a ~7x concentrating photovoltaic module. SPIE. 8108

 

Murray, MP, Gordon D, Brown SA, Lin W-C, Shell KA, Schuetz MA, Fowler S, Elman J, French RH.  2011.  Solar radiation durability framework applied to acrylic solar mirrors. Reliability of Photovoltaic Cells, Modules, Components, and Systems IV. 8112

 

Murray, MP, French RH.  2011.  Solar radiation durability of materials, components and systems for photovoltaics. Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE.

 

French, RH, Murray MP, Lin W-C, Shell KA, Brown SA, Schuetz MA, Davis RJ.  2011.  Solar Radiation Durability of Materials Components and Systems for Low Concentration Photovoltaic Systems. IEEE EnergyTech 2011.

 

Tan, GL, Denoyer LK, French RH, Ramos A, Gautier-Soyer M, Chiang YM.  2011.  Characterization of the Electronic Structure and Optical Properties of Al2O3, ZrO2 and SrTiO3 from Analysis of Reflection Electron Energy Loss Spectroscopy in the Valence Region. MRS Proceedings. 786

 

Smith, JR, Graat PCJ, Bonnell DA, French RH.  2011.  Relation between Local Composition, Chemical Environment and Phase Shift Behavior in Cr-Based Oxycarbonitride Thin Films. MRS Proceedings. 636

 

2010

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French, RH, Podgornik R, Rajter RF, Jagota A, Luo J, Asthagiri D, Chaudhury MK, Chiang Y-ming, Granick S, Kalinin S et al..  2010.  Long range interactions in nanoscale science. Reviews of Modern Physics. 82:1887–1944.

 

Šiber, A, Rajter RF, French RH, Ching WY, Parsegian VA, Podgornik R.  2010.  Optically anisotropic infinite cylinder above an optically anisotropic half space: Dispersion interaction of a single-walled carbon nanotube with a substrate. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 28:C4A17.

 

USDOE.  2010.  Science for Energy Technology: Strengthening the Link between Basic Research and Industry.

 

Rajter, R, French RH.  2010.  Van der Waals–London dispersion interaction framework for experimentally realistic carbon nanotube systems. International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde). 101:27–42.

 

2009

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Šiber, A, Rajter R, French R, Ching W, Parsegian V, Podgornik R.  2009.  Dispersion interactions between optically anisotropic cylinders at all separations: Retardation effects for insulating and semiconducting single-wall carbon nanotubes. Physical Review B. 80

 

R. H. French, R. Getty, PS.  2009.  Aromatic and Aromatic/Heteroaromatic Molecular Structures with Controllable Electron Conducting Properties.

 

R. H. French, WRC.  2009.  Use of Highly Purified Hydrocarbons in Vacuum Ultraviolet Applications.

 

R. C. Wheland, C. R. Fincher, F P QRHSW.  2009.  Packages for Alkanes Having Ultra-High Transparency at 193 nm.

 

Tran, HV, Hendrickx E, Van Roey F, Vandenberghe G, French RH.  2009.  Fluid-photoresist interactions and imaging in high-index immersion lithography. Journal of Micro/Nanolithography, MEMS and MOEMS. 8:033006.

 

French, RH, Tran HV.  2009.  Immersion Lithography: Photomask and Wafer-Level Materials. Annual Review of Materials Research. 39:93–126.

 

Yang, MK, Kaplan SG, French RH, Burnett JH.  2009.  Index of refraction of high-index lithographic immersion fluids and its variability. Journal of Micro/Nanolithography, MEMS and MOEMS. 8:023005.

 

French, RH, Rodriguez-Parada JM, Yang MK, Derryberry RA, Lemon MF, Brown MJ, Haeger CR, Samuels SL, Romano EC, Richardson RE.  2009.  Optical properties of materials for concentrator photovoltaic systems. 2009 34th IEEE Photovoltaic Specialists Conference (PVSC). :000394–000399.

 

2008

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R. H. French, WRC.  2008.  Highly Purified Liquid Perfluoroalkanes and Method for Preparing.

 

R. H. French, S. Peng, QW.  2008.  Processes and Devices Using Polycyclic Fluoroalkanes in Vacuum and Deep Ultraviolet Applications.

 

R. H. French, S. Peng, QW.  2008.  Use of Partially Fluorinated Polymers in Applications Requiring Transparency in the Ultraviolet and Vacuum Ultraviolet.

 

R. H. French, WRC.  2008.  Use of Perfluoro-n-alkanes in Vacuum Ultraviolet Applications.

 

Tran, HV, Hendrickx E, French RH, Adelman DJ, Rogado NS, Kaku M, Mocella M, Schmieg JJ, Chen CY, Van Roey F et al..  2008.  High Refractive Index Fluid Evaluations at 193nm: Fluid Lifetime and Fluid/Resist Interaction Studies. Journal of Photopolymer Science and Technology. 21:631–639.

 

French, RH, Tran HV, Adelman DJ, Rogado NS, Kaku M, Mocella M, Chen CY, Hendrickx E, Van Roey F, Bernfeld AS et al..  2008.  High-index immersion fluids enabling cost-effective single-exposure lithography for 32 nm half pitches. Proceedings of SPIE. 6924:692417–692417-8.

 

Rajter, RF, French RH.  2008.  New perspectives on van der Waals–London interactions of materials. From planar interfaces to carbon nanotubes. Journal of Physics: Conference Series. 94:012001.

 

Yang, MK, French RH, Tokarsky EW.  2008.  Optical properties of Teflon® AF amorphous fluoropolymers. Journal of Micro/Nanolithography, MEMS and MOEMS. 7:033010.

 

Rajter, R, French RH, Podgornik R, Ching WY, Parsegian AV.  2008.  Spectral mixing formulations for van der Waals–London dispersion interactions between multicomponent carbon nanotubes. Journal of Applied Physics. 104:053513.

 

2007

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Rajter, R, Podgornik R, Parsegian V, French R, Ching W.  2007.  van der Waals–London dispersion interactions for optically anisotropic cylinders: Metallic and semiconducting single-wall carbon nanotubes. Physical Review B. 76

 

R. H. French, WRC.  2007.  Radiation durable organic compounds with high transparency in the vacuum ultraviolet, and method for preparing.

 

Rajter, RF, French RH, Ching WY, Carter WC, Chiang YM.  2007.  Calculating van der Waals-London dispersion spectra and Hamaker coefficients of carbon nanotubes in water from ab initio optical properties. Journal of Applied Physics. 101:054303.

 

French, RH, Liberman V, Tran HV, Feldman J, Adelman DJ, Wheland RC, Qiu W, McLain SJ, Nagao O, Kaku M et al..  2007.  High-index immersion lithography with second-generation immersion fluids to enable numerical aperatures of 1.55 for cost effective 32-nm half pitches. Proceedings of SPIE. 6520:65201O–65201O-12.

 

French, RH, Winey KI, Yang MK, Qiu W.  2007.  Optical Properties and van der Waals–London Dispersion Interactions of Polystyrene Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry. Australian Journal of Chemistry. 60:251.

 

2006

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van Benthem, K, Tan G, French R, DeNoyer L, Podgornik R, Parsegian AV.  2006.  Graded interface models for more accurate determination of van der Waals–London dispersion interactions across grain boundaries. Physical Review B. 74

 

Feiring, AE, Crawford MK, Farnham WB, Feldman J, French RH, Junk CP, Leffew KW, Petrov VA, Qiu W, Schadt FL et al..  2006.  New Amorphous Fluoropolymers of Tetrafluoroethylene with Fluorinated and Non-Fluorinated Tricyclononenes. Semiconductor Photoresists for Imaging at 157 and 193 nm. Macromolecules. 39:3252–3261.

 

Tan, G, French R.  2006.  Optical properties, electronic structure and London dispersion interactions for nanostructured interfacial and surficial films. Materials Science and Engineering: A. 422:136–146.

 

Paumier, F, Fouquet V, Guittet M, Gautiersoyer M, French R, Tan G, Chiang Y, Tang M, Ramos A, Chung S.  2006.  Reflection electron energy loss spectroscopy of nanometric oxide layers and of their interfaces with a substrate. Materials Science and Engineering: A. 422:29–40.

 

Fain, SC, Polwarth CA, Tait SL, Campbell CT, French RH.  2006.  Simulated measurement of small metal clusters by frequency-modulation non-contact atomic force microscopy. Nanotechnology. 17:S121–S127.

 

R. H. French, WRC.  2006.  Polymer-liquid Compositions Useful in Ultraviolet and Vacuum Ultraviolet Uses.

 

R. H. French, S. Peng, QW.  2006.  Polycyclic Fluoroalkanes.

 

R. H. French, T. D. Gierke.  2006.  Method for Providing Nano-structures of Uniform Length.

 

Feiring, AE, Crawford MK, Farnham WB, French RH, Leffew KW, Petrov VA, Schadt FL, Tran HV, Zumsteg FC.  2006.  Bisfluoroalcohol Monomers and Polymers:  Improved Transparency Fluoropolymer Photoresists for Semiconductor Photolithography at 157 nm. Macromolecules. 39:1443–1448.

 

Podgornik, R, French RH, Parsegian VA.  2006.  Nonadditivity in van der Waals interactions within multilayers. The Journal of Chemical Physics. 124:044709.

 

R. H. French, WKI.  2006.  Origins and Applications of London Dispersion Interactions in Polymers and Other Materials: Electronic Structure, Optical Properties and Chemistry. Proceedings of the 28th Australasian Polymer Society Meeting.

 

R. H. French, W. Qiu.  2006.  Second generation fluids for 193nm immersion lithography. Proceedings of SPIE. 6154:615415–615415-7.

 

2005

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Tan, G, Lemon M, Jones D, French R.  2005.  Optical properties and London dispersion interaction of amorphous and crystalline SiO2 determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry. Physical Review B. 72

 

French, RH, Müllejans H, Jones DJ.  2005.  Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron Energy-Loss Spectroscopies. Journal of the American Ceramic Society. 81:2549–2557.

 

Thiele, ES, French RH.  2005.  Light-Scattering Properties of Representative, Morphological Rutile Titania Particles Studied Using a Finite-Element Method. Journal of the American Ceramic Society. 81:469–479.

 

Tan, GL, DeNoyer LK, French RH, Guittet MJ, Gautier-Soyer M.  2005.  Kramers–Kronig transform for the surface energy loss function. Journal of Electron Spectroscopy and Related Phenomena. 142:97–103.

 

Mo, S-D, Ching W-Y, French RH.  2005.  Electronic Structure of a Near Σ11 a-axis Tilt Grain Boundary in α-A12O3. Journal of the American Ceramic Society. 79:627–633.

 

R. H. French, F. L. Schadt, W ZRCFC.  2005.  Copolymers for Photoresists and Processes Therefor.

 

French, RH, Sewell H, Yang MK, Peng S, McCafferty D, Qiu W, Wheland RC, Lemon MF, Markoya L, Crawford MK.  2005.  Imaging of 32-nm 1:1 lines and spaces using 193-nm immersion interference lithography with second-generation immersion fluids to achieve a numerical aperture of 1.5 and a k1 of 0.25. Journal of Microlithography, Microfabrication, and Microsystems. 4:031103.

 

2004

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van Benthem, K, Tan G, DeNoyer L, French R, Rühle M.  2004.  Local OpticalProperties, Electron Densities, and London Dispersion Energies of Atomically Structured Grain Boundaries. Physical Review Letters. 93

 

Percec, S, Getty R, Marshall W, Skidd G, French R.  2004.  Synthesis, structural analysis, and self-assembly of phenylene ethynylene oligomers and their substituted derivat. Journal of Polymer Science Part A: Polymer Chemistry. 42:541–550.

 

French, RH.  2004.  Origins and Applications of London Dispersion Forces and Hamaker Constants in Ceramics. Journal of the American Ceramic Society. 83:2117–2146.

 

R. H. French, R. C. Wheland, ZFC.  2004.  Ultraviolet and Vacuum Ultraviolet Transparent Polymer Compositions and Their Uses.

 

R. H. French, R. C. Wheland, ZFC.  2004.  Ultraviolet and Vacuum Ultraviolet Transparent Polymer Compositions and Their Uses

 

R. H. French, M. K. Yang.  2004.  Immersion fluid refractive indices using prism minimum deviation techniques. Proceedings of SPIE. 5377:1689–1694..

 

K. Lee, S. Jockusch.  2004.  157-nm pellicles for photolithography: mechanistic investigation of the deep-UV photolysis of fluorocarbons. Proceedings of SPIE. 5377:1598–1605.

 

Synowicki, RA, Pribil GK, Cooney G, Herzinger CM, Green SE, French RH, Yang MK, Burnett JH, Kaplan S.  2004.  Fluid refractive index measurements using rough surface and prism minimum deviation techniques. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 22:3450.

 

R. A. Synowkicki, G. K. Pribil.  2004.  Immersion fluids for lithography: refractive index measurement using prism minimum deviation techniques. Semconductor Fabtech. :55–58.

 

S. Peng, R. H. French.  2004.  Second generation fluids for 193 nm immersion lithography. Proceedings of SPIE. 5754:427–434.

 

Kunz, RR, Switkes M, Sinta R, Curtin JE, French RH, Wheland RC, Kao C-P C, Mawn MP, Lin L, Wetmore P et al..  2004.  Transparent fluids for 157-nm immersion lithography. Journal of Microlithography, Microfabrication, and Microsystems. 3:73.

 

2003

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Tan, G-L, Lemon MF, French RH.  2003.  Optical Properties and London Dispersion Forces of Amorphous Silica Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry. Journal of the American Ceramic Society. 86:1885–1892.

 

Feiring, A.  2003.  Design of very transparent fluoropolymer resists for semiconductor manufacture at 157 nm. Journal of Fluorine Chemistry. 122:11–16.

 

French, R.  2003.  Novel hydrofluorocarbon polymers for use as pellicles in 157 nm semiconductor photolithography: fundamentals of transparency. Journal of Fluorine Chemistry. 122:63–80.

 

Lustig, SR, Boyes ED, French RH, Gierke TD, Harmer MA, Hietpas PB, Jagota A, {McLean} SR, Mitchell GP, Onoa BG et al..  2003.  Lithographically Cut Single-Walled Carbon Nanotubes:  Controlling Length Distribution and Introducing End-Group Functionality. Nano Letters. 3:1007–1012.

 

S. R. Lustig, E. D. Boyes.  2003.  Novel Process Methodology for Uniformly Cutting Nanotubes. MRS Proceedings. 772:M1.5

 

Frye, A, R.H., D.A..  2003.  Optical properties and electronic structure of oxidized and reduced single-crystal strontium titanate. 94:226–232.

 

M. K. Crawford, W. B. Farnham.  2003.  Single layer fluoropolymer resists for 157-nm lithography. Proceedings of SPIE. 5039:80–92.

 

2002

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Crawford, MK, Farnham WB, Feiring AE, Feldman J, French RH, Leffew KW, Petrov VA, Schadt III FL, Zumsteg FC.  2002.  Fluoropolymers for 157 nm Lithography: Performance of Single Layer Resists.. Journal of Photopolymer Science and Technology. 15:677–687.

 

A Grenville, V.. Liberman.  2002.  Behavior of candidate organic pellicle materials under 157-nm laser irradiation. Proceedings of SPIE. 4691:1644–1653.

 

Roger H. French, Robert C. Wheland.  2002.  157-nm pellicles: polymer design for transparency and lifetime. Proceedings of SPIE. 4691:576–583.

 

Steven R. Lustig, Edward D. Boyes, Sams KD.  2002.  A Novel Process Methodology for Cutting Uniform Nanostructures. AICHE 2002 Proceedings: Materials Processing in Nanoelectronics.

 

2001

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French, RH, Wheland RC, Gordon J, Zhang E.  2001.  Optimizing polymers to increase pellicle lifetime and transmission for 157-nm lithography. Micro. :79–93.

 

Roger H. French, Jerald Feldman.  2001.  Progress in Materials Development for 157nm Photolithography: Photoresists and Pellicles. Semiconductor Fabtech. :167–75.

 

van Benthem, K.  2001.  Valence electron energy loss study of Fe-doped SrTiO3 and a Σ13 boundary: electronic structure and dispersion forces. Ultramicroscopy. 86:303–318.

 

R. H. French, SKG.  2001.  Attenuating Phase Shift Photomasks.

 

Michael K. Crawford, Andrew E. Feiring.  2001.  157-nm imaging using thick single-layer resists. Proceedings of SPIE. :428–438.

 

van Benthem, K, Elsässer C, French RH.  2001.  Bulk electronic structure of SrTiO3: Experiment and theory. Journal of Applied Physics. 90:6156.

 

Smith, J, French RH, Duscher G, Bonnell D.  2001.  Consequence of Nanometer-Scale Property Variations to Macroscopic Properties of CrOCN Thin Films. Journal of the American Ceramic Society. 84:2873–2881.

 

McNeil, LE, French RH.  2001.  Light scattering from red pigment particles: Multiple scattering in a strongly absorbing system. Journal of Applied Physics. 89:283.

 

Roger H. French, Joseph Gordon.  2001.  Materials design and development of fluoropolymers for use as pellicles in 157-nm photolithography. Proceedings of SPIE. 4346:89–97.

 

McNeil, LE, Hanuska AR, French RH.  2001.  Near-field scattering from red pigment particles: Absorption and spectral dependence. Journal of Applied Physics. 89:1898.

 

McNeil, LE, Hanuska AR, French RH.  2001.  Orientation dependence in near-field scattering from TiO2 particles. Applied Optics. 40:3726.

 

2000

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McNeil, LE, French RH.  2000.  Multiple scattering from rutile TiO2 particles. Acta Materialia. 48:4571–4576.

R. French, Origins and applications of London dispersion forces and Hamaker constants in ceramics, Journal of the American Ceramic Society. 83 (2000) 2117–2146. doi:10.1111/j.1151-2916.2000.tb01527.x.

 

R. H. French, SKG.  2000.  Attenuating Phase Shift Photomasks.

 

R. H. French, R. C. Wheland.  2000.  Fluoropolymers for 157-nm lithography: optical properties from VUV absorbance and ellipsometry measurements. Proceedings of SPIE Vol. 4000. :1491–1502.

 

Michael K. Crawford, Andrew E. Feiring.  2000.  New materials for 157-nm photoresists: characterization and properties. Proceedings of SPIE. :357–364.

 

R. M. Cannon, M. Rühle, Saiz E.  2000.  Adsorption and Wetting Mechanisms at Ceramic Grain Boundaries. Ceramic Transactions. 118:427–44.

 

French, RH, Müllejans H.  2000.  Insights Into the Electronic Structure of Ceramics Through Quantitative Analysis of Valence Electron Energy-loss Spectroscopy VEELS. Microscopy and Microanalysis. 6:297–306.

 

1999

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Jones, DJ, French RH, Müllejans H, Loughin S, Dorneich AD, Carcia PF.  1999.  Optical properties of AlN determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry data. Journal of Materials Research. 14:4337–4344.

 

P. F. Carcia, FRH.  1999.  Attenuating Embedded Phase Shift Photomask Blanks.

 

P. F. Carcia, FRH.  1999.  Attenuating Embedded Phase Shift Photomask Blanks.

 

P. F. Carcia, R. H. French.  1999.  Optical superlattices as phase-shift masks for microlithography. Proceedings of SPIE. 3790:23–35.

 

P.F., Hughes G, R.H., Torardi C, Reynolds G, Dieu L.  1999.  Thin Films for Phase-shift Masks. :14–21.

 

1998

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Thiele, ES, French RH.  1998.  Computation of Light Scattering by Anisotropic Spheres of Rutile Titania. Advanced Materials. 10:1271–1276.

 

French, RH, Müllejans H, Jones DJ, Duscher G, Cannon RM, Rühle M.  1998.  Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging. Acta Materialia. 46:2271–2287.

 

Dorneich, French, Mullejans, Loughin, Ruhle.  1998.  Quantitative analysis of valence electron energy-loss spectra of aluminium nitride. Journal of Microscopy. 191:286–296.

 

G.A.M., R.H., P.F., C.C., Hughes G, Jones DJ, M.F., Reilly M, Wilson L, C.R..  1998.  TiSi-nitride attenuating phase-shift photomask for 193 nm lithography. Proceedings of SPIE. 3456:514–523.

 

1997

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Robert W. Johnson, Erik S. Thiele, French RH.  1997.  Light-scattering efficiency of white pigments: an analysis of model core - shell pigments vs. optimized rutile TiO2. TAPPI Journal. 80:233–239.

 

E. S. Thiele, FRH.  1997.  Computational Modeling of TiO2 Particle Optics Using a Finite Element Method. Proceedings of the Paint Research Association.

 

H. Müllejans, R. H. French, D RGM.  1997.  Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure. Proceedings of the Microscopy Society of America.

 

Carcia, PF, French RH, Reilly MH, Lemon MF, Jones DJ.  1997.  Optical superlattices—a strategy for designing phase-shift masks for photolithography at 248 and 193 nm: Application to AlN/CrN. Applied Physics Letters. 70:2371.

 

1996

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Ching, W, Xu Y-N, French R.  1996.  First-principles investigation of the optical properties of crystalline poly(di-n-hexylsilane). Physical Review B. 54:13546–13550.

 

Loughin, S, French RH, Noyer DLK, Ching W-Y, Xu Y-N.  1996.  Critical point analysis of the interband transition strength of electrons. Journal of Physics D: Applied Physics. 29:1740–1750.

 

Müllejans, H, French RH.  1996.  Interband electronic structure of a near-sigma11 grain boundary in -alumina determined by spatially resolved valence electron energy-loss spectroscopy. Journal of Physics D: Applied Physics. 29:1751–1760.

 

Mo, S-D, Ching WY, French RH.  1996.  Optical properties of a near-Sigma-11 a axis tilt grain boundary in alpha-Al2O3. Journal of Physics D: Applied Physics. 29:1761–1766.

 

Ackler, H.  1996.  Comparisons of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties. Journal of Colloid and Interface Science. 179:460–469.

 

P.F., R.H., Sharp K, J.S., B.W..  1996.  Materials Screening for Attenuating Embedded Phase-Shift Photoblanks for DUV and 193 nm Photolithography. SPIE. 2884:255–263.

 

Argento, C, French RH.  1996.  Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy. Journal of Applied Physics. 80:6081.

 

1995

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U. Alpay, R. H. French, KF.  1995.  Photomask Blanks.

 

U. Alpay, R. H. French, KF.  1995.  Photomask Blanks Comprising Transmissive Embedded Phase Shifter.

 

L. Drozdyk, R. H. French.  1995.  Light Absorbing Dielectric Compositions.

 

French, R.  1995.  Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths. Solid State Ionics. 75:13–33.

 

R. H. French, C. Scheu.  1995.  Interfacial Electronic Structure and Full Spectral Hamaker Constants of Si3N4 Intergranular Films from VUV and SR-VEEL Spectroscopy. Proceedings of the Symposium on Structure and Properties of Interfaces in Ceramics. :243–258.

 

S. M. Gaspar Wilson, S. S. H. Naqvi.  1995.  Metrology of etched quartz and chrome embedded phase shift gratings using scatterometry. Proceedings of SPIE. 2439:479–494.

 

1994

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Chen, Y, Clinard F, Evans B, Farnum E, French R, Gonzalez R, Odwyer J, Wiffen F, Zong X.  1994.  Electrical breakdown of insulating ceramics in a high-radiation field. Journal of Nuclear Materials. 217:32–47.

 

Chiang, Y-M, Silverman LA, French RH, Cannon RM.  1994.  Thin Glass Film between Ultrafine Conductor Particles Thick-Film Resistors. Journal of the American Ceramic Society. 77:1143–1152.

 

French, R, Glass S, Ohuchi F, Xu Y, Ching W.  1994.  Experimental and theoretical determination of the electronic structure and optical properties of three phases of ZrO2. Physical Review B. 49:5133–5142.

 

French, RH, Jones DJ, Loughin S.  1994.  Interband Electronic Structure of alpha-Alumina up to 2167 K. Journal of the American Ceramic Society. 77:412–422.

 

Handwerker, CA, Cannon RM, French RH.  1994.  Robert L. Coble: A Retrospective. Journal of the American Ceramic Society. 77:293–297.

 

Kalk, FD, French RH, Alpay HU, Hughes G.  1994.  Attenuated Phase Shifting Photomasks Fabricated from Cr-Based Embedded Shifter Blanks. SPIE. 2254:67–40.

 

F. D. Kalk, R. H. French, A HHUG.  1994.  Chromium-based attenuated embedded shifter preproduction. Proceedings of SPIE. 2322:299–304.

 

Johs, B, French RH, Kalk FD, McGahan WA, Woollam JA.  1994.  Optical Analysis of Complex Multilayer Structures Using Multiple Data Types. SPIE. 2253:1098–1106.

 

H. Mullejans, J. Bruley, F MRHPA.  1994.  Quantitative Electronic Structure Analysis of a-Al2O3 Using Spatially Resolved Valence Electron Energy-Loss Spectra. Mat. Res. Soc. Symp. Proc.. 332:169–176.

 

1993

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Xu, Y-N, Ching W, French R.  1993.  Electronic structure and interatomic bonding of crystalline β-BaB2O4 with comparison to LiB3O5. Physical Review B. 48:17695–17702.

 

Mcneil, LE, Grimsditch M, French RH.  1993.  Vibrational Spectroscopy of Aluminum Nitride. Journal of the American Ceramic Society. 24:1132–36.

 

Loughin, S, French RH, Ching WY, Xu YN, Slack GA.  1993.  Electronic structure of aluminum nitride: Theory and experiment. Applied Physics Letters. 63:1182.

 

H. Muellejans, J. Bruley, F MRHPA.  1993.  Quantitative Electronic Structure Analysis of a-Al2O3 Using Spatially Resolved Valence Energy-loss Spectra. Electron Microscopy and Analysis Group EMAG of Royal Microscopical Society Proceedings. :59–62.

 

1992

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French, R, Meth J, Thorne J, Hochstrasser R, Miller R.  1992.  Vacuum ultraviolet spectroscopy of the optical properties and electronic structure of seven poly(di-alkylsilanes). Synthetic Metals. 50:499–508.

 

Thorne, J, Hochstrasser R, Zeigler J, Tilgner A, Peter H, French R, Fagan P, Miller R.  1992.  Electronic and Vibrational Excitations in Polysilanes and Oligomers. Molecular Crystals and Liquid Crystals. 216:13–19.

 

French, RH, Abou-Rahme R, Jones DJ, Mcneil LE.  1992.  Absorption Edge and Band Gap of SiO2 Fused Silica Glass. Ceramic Transactions. 28:63–80.

 

1991

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French, R, Ling J, Ohuchi F, Chen C.  1991.  Electronic structure of β-BaB2O4 and LiB3O5 nonlinear optical crystals. Physical Review B. 44:8496–8502.

 

Bonnell, DA.  1991.  Tunneling spectroscopic analysis of optically active wide band-gap semiconductors. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 9:551.

 

Schellenberg, F, Byer R, French R, Miller R.  1991.  Vacuum-ultraviolet spectroscopy of dialkyl polysilanes. Physical Review B. 43:10008–10011.

 

F. M. Schellenberg, R. L. Byer.  1991.  Linear and Nonlinear Optics of Substituted Polysilanes. Proc. IUPAC Symp. Macromol.. :73–95.

 

1990

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Rohrer, GS, Bonnell DA, French RH.  1990.  Detection of Optically Excited States in Wide-Band-Gap Semiconductors with Tunneling Spectroscopy. Journal of the American Ceramic Society. 73:3257–3263.

 

French, RH.  1990.  Laser-plasma sourced, temperature dependent, VUV spectrophotometer using dispersive analysis. Physica Scripta. 41:404–408.

 

Bortz, ML, French RH, Jones DJ, Kasowski RV, Ohuchi FS.  1990.  Temperature dependence of the electronic structure of oxides: MgO, MgAl O and Al. Physica Scripta. 41:537–541.

 

Kraus, DJ, French RH.  1990.  Automatic Spectral Database and Archive System for Optical Spectroscopy. Applied Spectroscopy. 44:1221–1226.

 

French, RH, Kasowski RV, Ohuchi FS, Jones DJ, Song H, Coble RL.  1990.  Band Structure Calculations of the High-Temperature Electronic Structure of Magnesium Oxide. Journal of the American Ceramic Society. 73:3195–3199.

 

French, RH.  1990.  Electronic Band Structure of Al2O3, with Comparison to Alon and AIN. Journal of the American Ceramic Society. 73:477–489.

 

R. H. French, BJB.  1990.  Electronic Structure and Conductivity of Al2O3. Ceramic Transactions. 7:111–34.

 

Innocenzi, ME, Swimm RT, Bass M, French RH, Kokta MR.  1990.  Optical absorption in undoped yttrium aluminum garnet. Journal of Applied Physics. 68:1200.

 

Innocenzi, ME, Swimm RT, Bass M, French RH, Villaverde AB, Kokta MR.  1990.  Room-temperature optical absorption in undoped α-Al2O3. Journal of Applied Physics. 67:7542.

 

S. Loughin, R. H. French.  1990.  A Vacuum Ultraviolet Investigation of the Electronic Structure of Single- and Polycrystalline Aluminum Nitride.

 

Y. N. Xu, W. Y. Ching, FRH.  1990.  Self-consistent Band Structures and Optical Calculations in Cubic Ferroelectric Perovskites. Ferroelectrics. 111:23–32.

 

1989

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Bortz, ML, French RH.  1989.  Quantitative, FFT-Based, Kramers-Krönig Analysis for Reflectance Data. Applied Spectroscopy. 43:1498–1501.

 

French, RH.  1989.  Vacuum Ultraviolet Spectroscopy of Ceramics. Ceramic Transactions. 5:406–19.

 

P. A. Morris, M. K. Crawford.  1989.  Defects in KTiOPO4. Materials Research Society Symposium Proceedings. 152:95–101.

 

Song, H, French RH, Coble RL.  1989.  Effect of Residual Strain on the Electronic Structure of Alumina and Magnesia. Journal of the American Ceramic Society. 72:990–994.

 

Bortz, ML, French RH.  1989.  Optical reflectivity measurements using a laser plasma light source. Applied Physics Letters. 55:1955.

 

D. P. Button, B. A. Yost.  1989.  Ceramic-Fiber / Polymer Laminates : Thermally Conductive Composites With Low Dielectric Constants. Advances in Ceramics. 26:353–73.

 

1988

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Ohuchi, FS.  1988.  Summary Abstract: Effect of oxygen incorporation in AlN thin films. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 6:1695.

 

Kasowski, R, Ohuchi F, French R.  1988.  Theoretical and experimental studies on Cu metallization of Al2O3. Physica B+C. 150:44–46.

 

French, R, Coble R, Kasowski R, Ohuchi F.  1988.  Vacuum ultraviolet, photoemission and theoretical studies of the electronic structure of Al2O3 up to 1000°C. Physica B+C. 150:47–49.

 

Tebbe, FN, Morris PA, French RH, Chowdhry U, Coble RL.  1988.  Purity of Aluminum Hydroxide Derived from Triethylaluminum. Journal of the American Ceramic Society. 71:C–204-C-206.

 

R. H. French, BJD.  1988.  Polymer Ceramic Composites for Electronic Packaging Applications. Advanced Materials & Processes. 134:32–35.

 

1987

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Ohuchi, FS.  1987.  Summary Abstract: A study of room-temperature Cu–Al2O3 and Cu–AlN interfacial reactions. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 5:1175.

 

Allison, C, Modine F, French R.  1987.  Optical and electrical properties of niobium carbide. Physical Review B. 35:2573–2582.

 

Ohuchi, FS, French RH, Kasowski RV.  1987.  Cu deposition on Al2O3 and AlN surfaces: Electronic structure and bonding. Journal of Applied Physics. 62:2286.

 

1986

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P. A. Morris, R. H. French.  1986.  Clean-room and CO2-Laser Processing of Ultra High-Purity Al2O3. Materials Research Society Proceedings. 60:79–86.

 

1985

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R. H. French, CRL.  1985.  Temperature Dependence of VUV Optical Spectra and Band Structure Al2O3. Proceedings of the Topical Conference on Basic Properties of Optical Materials. :126–29.

 

1983

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R. H. French, CRL.  1983.  High Temperature Electronic Structure of Single Crystal Sapphire. Proc. of the 7th Int. Conf. on Vacuum Ultraviolet Radiation Physics. 6:261–63.

 

R. H. French, H. P. Jenssen, Coble RL.  1983.  High Temperature VUV Spectrophotometer. Annals of the Israeli Physical Society. 6:261–63.

 

1979

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R. C. Koeller, R. H. French, RR.  1979.  Use of Holographic Interferometry to Study Crack Propagation in Metal-Plastic Composites. Proc. of the Conf. on Failure Modes in Composites IV. :164–75.

 

Horstman, R, Lieb K, Power B, Meltzer R, Vieth M, French RH, Raj R.  1979.  Use of the Double Torsion Method to Study Crack Propagation in an Adhesive Layer. Journal of Testing and Evaluation. 7:160.