Tran, H., Hendrickx, E., Van Roey, F., Vandenberghe, G., & French, R. H.().Fluid-photoresist interactions and imaging in high-index immersion lithography.Journal of {Micro/Nanolithography}, {MEMS} and {MOEMS},8, 033006.
French, R. H., & Tran, H. H.().Immersion Lithography: Photomask and {Wafer-Level} Materials.Annual Review of Materials Research,39, 93–126.
Tran, H., Hendrickx, ., French, R. H., Adelman, . H., Rogado, . H., Kaku, . H., Mocella, M. H., Schmieg, J. H., Chen, C. H., Van Roey, F. H., Bernfeld, A. H., & Derryberry, R. H.(2008).High Refractive Index Fluid Evaluations at 193nm: Fluid Lifetime and {Fluid/Resist} Interaction Studies.Journal of Photopolymer Science and Technology,21, 631–639.
Tran, H., French, R., Adelman, D., Feldman, J., Qiu, W., Wheland, R., Brubaker, L., Fischel, B., Fones, B., Lemon, M., Yang, M., Nagao, O., Kaku, M., Mocella, M., & Schmieg, J.().Evaluation of Next Generation Fluids for {ArF} Immersion Lithography Beyond Water.Journal of Photopolymer Science and Technology,20, 729–738.
Feiring, A., Crawford, M., Farnham, W., Feldman, J., French, R. H., Junk, C. H., Leffew, K. H., Petrov, V. H., Qiu, W. H., Schadt, F. H., Tran, H. H., & Zumsteg, F. H.(2006).New Amorphous Fluoropolymers of Tetrafluoroethylene with Fluorinated and {Non-Fluorinated} Tricyclononenes. Semiconductor Photoresists for Imaging at 157 and 193 nm.Macromolecules,39, 3252–3261.
French, R. H., Qiu, W. H., Yang, S. H., Wheland, R. H., Lemon, M. H., Shoe, A. H., Adelman, D. H., Crawford, M. H., Tran, H. H., Feldman, J. H., McLain, S. H., & Peng, S. H.(2006).Second generation fluids for 193nm immersion lithography..
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