Hoang Tran

Publications

Tran, H., Hendrickx, E., Van Roey, F., Vandenberghe, G., & French, R. H. (). Fluid-photoresist interactions and imaging in high-index immersion lithography. Journal of {Micro/Nanolithography}, {MEMS} and {MOEMS}, 8 , 033006.
French, R. H., & Tran, H. H. (). Immersion Lithography: Photomask and {Wafer-Level} Materials. Annual Review of Materials Research, 39 , 93–126.
Tran, H., Hendrickx, ., French, R. H., Adelman, . H., Rogado, . H., Kaku, . H., Mocella, M. H., Schmieg, J. H., Chen, C. H., Van Roey, F. H., Bernfeld, A. H., & Derryberry, R. H. (2008). High Refractive Index Fluid Evaluations at 193nm: Fluid Lifetime and {Fluid/Resist} Interaction Studies. Journal of Photopolymer Science and Technology, 21 , 631–639.
Tran, H., French, R., Adelman, D., Feldman, J., Qiu, W., Wheland, R., Brubaker, L., Fischel, B., Fones, B., Lemon, M., Yang, M., Nagao, O., Kaku, M., Mocella, M., & Schmieg, J. (). Evaluation of Next Generation Fluids for {ArF} Immersion Lithography Beyond Water. Journal of Photopolymer Science and Technology, 20 , 729–738.
Feiring, A., Crawford, M., Farnham, W., Feldman, J., French, R. H., Junk, C. H., Leffew, K. H., Petrov, V. H., Qiu, W. H., Schadt, F. H., Tran, H. H., & Zumsteg, F. H. (2006). New Amorphous Fluoropolymers of Tetrafluoroethylene with Fluorinated and {Non-Fluorinated} Tricyclononenes. Semiconductor Photoresists for Imaging at 157 and 193 nm. Macromolecules, 39 , 3252–3261.
French, R. H., Qiu, W. H., Yang, S. H., Wheland, R. H., Lemon, M. H., Shoe, A. H., Adelman, D. H., Crawford, M. H., Tran, H. H., Feldman, J. H., McLain, S. H., & Peng, S. H. (2006). Second generation fluids for 193nm immersion lithography. .
Feiring, A., Crawford, M., Farnham, W., French, R. H., Leffew, K. H., Petrov, V. H., Schadt, F. H., Tran, H. H., & Zumsteg, F. H. (2006). Bis(fluoroalcohol) Monomers and Polymers:  Improved Transparency Fluoropolymer Photoresists for Semiconductor Photolithography at 157 nm. Macromolecules, 39 , 1443–1448.
Crawford, M., Farnham, W., Feiring, A., Feldman, J., French, R. H., Leffew, K. H., Petrov, V. H., Qiu, W. H., Schadt, F. H., Tran, H. H., Wheland, R. H., & Zumsteg Jr., F. H. (2003). Single layer fluropolymer resists for 157-nm lithography. Proceedings of SPIE.