French, R. H., Müllejans, H. H., & Jones, D. H.(2011).Optical properties of {AlN} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry data.Journal of Materials Research,14, 4337-4344.
French, R. H., Müllejans, H. H., & Jones, D. H.(2005).Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron {Energy-Loss} Spectroscopies.Journal of the American Ceramic Society,81, 2549–2557.
French, R. H., & Müllejans, H. H.(2000).Insights Into the Electronic Structure of Ceramics Through Quantitative Analysis of Valence Electron Energy-loss Spectroscopy {(VEELS)}.Microscopy and Microanalysis,6, 297-306.
French, R. H., Müllejans, H. H., & Jones, D. H.(1998).Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging.Acta Materialia,46(7),2271-2287.
French, R. H., & Müllejans, H. H.(1997).Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure.Proceedings of the Microscopy Society of America.
French, R. H., & Müllejans, H. H.(1996).Interband electronic structure of a near- grain boundary in -alumina determined by spatially resolved valence electron energy-loss spectroscopy.Journal of Physics D: Applied Physics,29(7),1751-1760.
French, R. H., & Müllejans, H. H.(1993).Quantitative Electronic Structure Analysis of {a-Al2O3} Using Spatially Resolved Valence Energy-loss Spectra.{IOP} Publishing.
