2007,""7,300,743,Roger French, David Jones, & Robert Wheland.
Publications
French, R. H., Müllejans, H. H., & Jones, D. H.(2011).Optical properties of {AlN} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry data.Journal of Materials Research,14, 4337-4344.
French, R. H., Gordon, J. H., Jones, D. H., Wheland, R. H., Zhang, X. H., Zumsteg, F. H., Sharp, K. H., & Qiu, W. H.(2001).Materials design and development of fluoropolymers for use as pellicles in 157-nm photolithography.Proc. SPIE 4346.
French, R. H., Wheland, R. H., Jones, D. H., Hilfiker, J. H., Synowicki, R. H., Zumsteg, F. H., Feldman, J. H., & Feiring, A. H.(2000).Fluoropolymers for 157-nm lithography: optical properties from {VUV} absorbance and ellipsometry measurements.Proceedings of SPIE Vol. 4000,4000
French, R. H., Francis Carcia, P. H., Reynolds, G. H., Hughes, G. H., Torardi, C. H., Jones, D. H., & Dieu, L. H.(1999).Optical superlattices as phase-shift masks for microlithography.Proceedings of SPIE,3790
French, R. H., Reynolds, G. H., Francis Carcia, P. H., Torardi, C. H., Hughes, G. H., & Jones, D. H.(1998).{TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography.SPIE,3546
French, R. H., Müllejans, H. H., & Jones, D. H.(1998).Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging.Acta Materialia,46(7),2271-2287.
French, R. H., Francis Carcia, P. H., & Jones, D. H.(1997).Optical superlattices—a strategy for designing phase-shift masks for photolithography at 248 and 193 nm: Application to {AlN/CrN}.Applied Physics Letters,70(18),2371-2373.
French, R. H., Jones, D. H., & Loughin, S. H.(1994).Interband Electronic Structure of {alpha-Alumina} up to 2167 K.Journal of the American Ceramic Society,77(2),412-422.
French, R. H., Kasowski, R. H., Ohuchi, . H., Jones, D. H., Coble, R. H., & Song, H. H.(1990). Band Structure Calculations of the {High-Temperature} Electronic Structure of Magnesium Oxide.Journal of the American Ceramic Society,73(11),3195-3199.