The Swagelok Center for Surface Analysis of Materials will host a one-day short course on structural and compositional analysis solutions on Monday, Oct. 23.
The even is open to graduate students, post-doctoral fellows, faculty and anyone interested in microscopy and surface analysis.
The morning session runs from 9 a.m.-noon and includes topics like X-ray photoelectron spectroscopy, auger electron spectroscopy and X-ray diffraction. The afternoon session runs from 1-5 p.m. and will cover topics from scanning electron microscopy to electron backscattered diffraction to atomic force microscopy.
Refreshments will be served in the morning and during the lunch break.
To register, email Sharon Dingess at firstname.lastname@example.org and use “2017 registration for SCSAM short course” in the subject line.