Scanning Electron Microscopy (SEM)

SCSAM has one high resolution stand-alone SEM and three "dual beam" (SEM/FIB) instruments.  Each instrument has unique capabilities and users are encouraged to use the instrument best suited for their samples and tasks.

FEI Quanta 3D Environmental Scanning Electron Microscope with Focused Ion Beam and XEDS

FEI Nova Nanolab 200 Field Emission Scanning Electron Microscope with Focused Ion Beam, XEDS and EBSD

FEI Helios 650 Field Emission Scanning Electron Microscope with Focused Ion Beam with XEDS