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EECS professor Christian Zorman named a fellow of the American Vacuum Society

Case School of Engineering's Christian Zorman, professor of electrical engineering and computer science, has been elected a fellow of the American Vacuum Society (AVS) for pioneering work in the development of CVD deposition techniques and mechanical characterization of silicon carbide thin films that proved critical to the development of harsh environment MEMS.

Zorman will be inducted at the AVS Awards Ceremony during the AVS International Symposium in Tampa, Florida, on Nov. 1.

AVS fellows are nominated by their peers for sustained and outstanding scientific and technical contributions in areas of interest to AVS. Fellowship is the premier membership recognition within the society, with fellowship not exceeding 0.5 percent of the membership. Zorman is the first faculty member from the university to receive this honor. 

The American Vacuum Society is an interdisciplinary, professional society that supports basic science, technology development and commercialization within the areas of materials, interfaces and processing.