Banner_swagelok

About the Swagelok Center

The Swagelok Center Surface Analysis of Materials is a multi-user analytical facility at Case Western Reserve University that provides access to a wide range of characterization techniques for both academic and industrial clients at Federally approved hourly use charges.

All of the major instruments listed below are maintained on a day-to-day basis by a dedicated and expert engineering staff (seven full-time employees), supplemented by comprehensive service contracts by the various equipment vendors.  More importantly, the aggregate experience of the SCSAM staff, which totals nearly 100 years, provides for expert instruction on data acquisition, interpretation, and design of experiments.  Further, the faculty in the Case School of Engineering and the Colleges of Arts and Science are available for consultation as necessary.

                                   SCSAM Instruments

  • Hitachi S-4500 Field-Emission Gun Scanning Electron Microscope (SEM)
  • FEI Nova Nanolab Dual Beam Focused Ion Beam (FEG SEM+FIB) System
  • FEI Quanta 3D Environmental SEM with FIB (ESEM+FIB)
  • Philips / FEI Tecnai F30 Scanning Transmission Electron Microscope
  • Zeiss Libra 200EF Energing Filtering Scanning Transmission Electron Microscope
  • Physical Electronics PHI-680 Scanning Auger Nanoprobe System
  • Physical Electronics VersaProbe X-ray Photo-Electron Spectrometer (XPS)
  • Physical Electronics TRIFT V Time-Of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS)
  • NEC 5SDH Tandem Pelletron Ion Accelerator
  • Scintag X-1 Advanced X-Ray Diffractometer
  • Veeco DI Atomic Force Microscope (AFM) with Hysitron Nano-indenter
  • Agilent G200 Nanoindenter
  • RHK 7500 UHV Variable-Temperature Scanning Probe System
  • Olympus FV-1000 Scanning Confocal Microscope
  • Fischione Nanomill